E6832A W-CDMA Cal Application for the E6601A Wireless Communications Test Set
| Product Status: | Discontinued | Currently Supported |
|---|---|
| Supported Until: | 1 November 2012 |
A replacement for this product is available:
Key Features & Specifications
This product will be discontinued with a last order date of October 31, 2011. It will be replaced by the E1963A, one of the E5515C applications.
Features
- W-CDMA ARB source for flexible phone receiver (RSSI) testing
- Full set of high-speed transmitter measurements support all W-CDMA/HSDPA chipset calibration
- Dynamic Power provides fast series of power measurements for high-speed amplitude characterization (requires chipset support)
- Optional Fast Device Tune capability combines Dynamic Power, frequency hopping and simultaneous source (RSSI) for high-speed transmitter and receiver characterization of supported chipsets
Accuracy
- QPSK Modulation Residual EVM < 10% (< 3% typical)
- Channel Power measurement < +\- 0.6 dB (< +\- 0.3 dB typical)
- EVM measurement < +\- 2.5% rms
Dynamic Range
- Channel Power measurement -65 dBm to +28 dBm
- Waveform Quality measurement -25 dBm to +28 dBm
Description
The Agilent E6832A W-CDMA cal application for the E6601A test set provides all the necessary capabilities to calibrate your W-CDMA and HSDPA mobile devices. This cal application, designed for non-signaling test in high-volume manufacturing, helps you achieve your time-to-market goals while lowering your cost of test for W-CDMA and HSDPA wireless devices.
This W-CDMA/HSDPA test solution is based on the new, next-generation, high-performance E6601A test set. You gain the benefits of industry leading measurement speed, optional time-based and portable licensing, and an integrated open Windows PC. With applications focused on calibration, flexible licensing, a built-in PC and high-speed measurements, the next-generation capabilities of this test set offers a UMTS calibration solution that can increase your throughput and reduce your test costs.
- ARB source for flexible phone receiver (RSSI) testing
-
Fullset of transmitter measurements:
- Mean Power and RRC-filtered Power
- Adjacent Channel Leakage Ratio
- Spectrum Emission Mask
- EVM
- Frequency Error
- Peak Code Domain Error
- Occupied Bandwidth - Dynamic power for fast series of power measurements
-
High-performance Spectrum Monitor
- Spectral analysis in a Windows interface -
Optional Fast Device Tune capability
- Simultaneous Tx Power and RSSI measurements in 20 ms step sizes
- Upgrade available for variable step sizes from 5 ms to 20 ms
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