Parameter & Device Analyzers, Curve Tracers

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Summary

Complete Parametric Test Solutions for both Beginning and Advanced Users

The Agilent Semiconductor Parameter/Device Analyzer Series provides both a traditional and new, task-oriented approach to device characterization in response to the differing needs of today’s users. Experienced users with in-depth hardware knowledge will appreciate the traditional parameter analyzer capabilities of the 4155 and 4156 instruments. These instruments are a good choice for current users who have created algorithms and software specifically for these products and do not feel the need to change. New users who are less familiar with hardware intricacies will find the B1500A’s application-focused measurement method an intuitive, easy-to-use approach to device characterization.

In addition, the B1505A offers a one-box solution for power device analysis and its curve-tracer mode with knob sweep support provides an easy and intuitive user interface.

Parameter & Device Analyzer Comparison, click here.

click to collapse this panelMore Information

  • Agilent B1500A Semiconductor Device Analyzer B1500A Semiconductor Device Analyzer
    Windows-based semiconductor device characterization instrument that provides integrated CV and IV measurements from an intuitive touch-screen interface.
  • B1505A B1505A Power Device Analyzer / Curve Tracer
    Windows-based power device analyzer supports fast and easy analysis of power devices and includes a curve tracer mode with a knob sweep function.
  • 4155C 4155C Semiconductor Parameter Analyzer
    Agilent 4155C offers all inclusive instrument solutions and easy operation for various parametric tests. It is a cost-effective, accurate laboratory bench top solution for advanced device characterization.
  • 4156C 4156C Precision Semiconductor Parameter Analyzer
    In addition to 4155C, Agilent 4156C offers highly accurate laboratory bench top solution for advanced device characterization.
  • Modular Source Monitor Unit Modular SMU Series
    A flexible family of products, with solutions for both precise parametric measurement of semiconductor devices and high speed testing of components (E5260A, E5262A, E5263A and E5270B).
  • Agilent B2200A fA Leakage Switch Mainframe Low-leakage Switch Matrix Family
    Low-leakage switch mainframe solutions, positioned between the semiconductor parameter analyzer and the wafer, reduce cost of test through characterization test automation (B2200A, B2201A and E5250A).
  • EE & DEE EasyEXPERT software and Desktop EasyEXPERT software
    EasyEXPERT software & Desktop EasyEXPERT software provide powerful new parametric measurement capabilities. The latest version of EasyEXPERT software now includes over 230 application tests, conveniently organized by device type and function.

 

click to collapse this panelDiscontinued & Obsolete