Parametric Test

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Integrated circuit devices continue to shrink in size, increase in density, and improve in performance every year. Manufacturing and testing these devices while simultaneously maintaining and improving yield has become increasingly difficult. Nevertheless, Agilent Technologies' parametric test solutions continue to meet these challenges and to provide users with consistently accurate and highly automated test solutions for better process monitoring. Our award winning parametric test systems are a de facto industry standard, with over 3,700 systems installed worldwide. With a history of over 60 years of innovation and leadership in the Test and Measurement industry, Agilent knows what it takes to meet the stringent demands of parametric test customers.

See our new location for parameter and device analyzers.

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  • Production Test Systems
    Agilent has two families of production parametric testers, the 4070 Series, and the 4080 Series.
  • 41000 Series
    The Agilent 41000 Series is a highly accurate CV-IV parametric measurement solution for the characterization of wafers in low-volume R&D, laboratory and process development environments.
  • Reliability Test
    The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).
  • Parametric Test System Services
    Service and support solutions are essential components in any semiconductor test operation. Explore a full suite of offerings available on Parametric Test Systems.
  • Parametric Test Software
    Intuitive software solutions designed to help you measure, analyze, report, and manage parametric test data.
  • Parameter & Device Analyzers, Curve Tracers
    See our new location for Parameter / Device Analyzers, Modular SMU Series and Low-leakage Switch Matrix Family

 

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