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Agilent 81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1)
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane. |
2004-10-12 | Application Note | ||
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Agilent 81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2)
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ... |
2004-10-18 | Application Note | ||
| Agilent Pulse Parameter Definitions
Definitions of Terms used with Pulse/Pattern/Data Generators |
2002-04-08 | Application Note | |||
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Magneto-Optical Disk Drive Research (PN 3)
This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive. |
2004-07-29 | Application Note | ||
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Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ... |
2006-12-12 | Application Note | ||
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USB Pre-Compliance Testing with Agilent Infiniium
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution... |
2006-11-14 | Application Note |
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