Talk with an Expert

Agilent 4294A Product Photograph

4294A Precision Impedance Analyzer, 40 Hz to 110 MHz

Product Status:	Currently Orderable \| Currently Supported
Product Upgrades:	Hardware, Software & Firmware Upgrades

Application Notes

1-15 of 15

Results

		Title/Description	Date	Type
	PDF 599 KB	8 Hints For Successful Impedance Measurement (AN 346-4) Selection criteria, device characteristics, fixturing and error correction etc.	2000-06-01	Application Note
	PDF 201 KB	Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A This application brief describes the benefits of using the Agilent 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.	2007-04-06	Application Note
	PDF 2.25 MB	Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3) This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.	2001-07-31	Application Note	order a copy
	PDF 461 KB	Achieving Fast Design Cycle Time Using an Electronic Design Automation (EDA) Tool and Impedance Anal This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.	2008-11-13	Application Note	order a copy
	PDF 116 KB	Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2) This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.	2008-04-10	Application Note	order a copy
	PDF 235 KB	Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.	2007-03-31	Application Note
	PDF 1.01 MB	Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3) As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.	2003-06-26	Application Note	order a copy
	PDF 2.02 MB	Impedance Measurement Handbook Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.	2009-06-17	Application Note	order a copy
	PDF 1.42 MB	Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4) This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.	2009-10-28	Application Note	order a copy
	PDF 322 KB	MEMS On-wafer Evaluation in Mass Production This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.	2008-11-12	Application Note
		MEMS/NEMS Device Measurement Solution Agilent helps you characterize MEMS/NEMS device.	2008-06-04	Application Note
	PDF 331 KB	New Technologies for Accurate Impedance Measurement (40Hz to 110MHz) Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...	2008-11-20	Application Note	order a copy
	PDF 1.64 MB	Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1) This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.	2008-10-28	Application Note	order a copy
	PDF 428 KB	Total Analysis Environment for Modeling Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.	2008-08-21	Application Note	order a copy
	PDF 506 KB	Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.	2009-02-03	Application Note	order a copy

1-15 of 15