53149A Product Photograph

53149A Microwave Frequency Counter/Power Meter/DVM, 46 GHz

Product Status: Currently Orderable | Currently Supported

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Title/Description Date Type
2009 Test and Measurement Course Calendar
List of Test and Measurement courses offered in your country.
Classroom Training
3G Technology Overview
This 2 day course will introduce engineers to the concepts of third generation cellular technologies.
Classroom Training
PDF PDF 1.77 MB ADMF: Facing the challenges of Super speed USB 3.0 Product Development
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development
2008-11-12 Seminar Materials
PDF PDF 2.66 MB ADMF: Microchip Full Speed USB Microcontrollers
Agilent Digital Measurement Forum (ADMF): Microchip Full Speed USB Microcontrollers
2008-11-12 Seminar Materials
Agilent 3070 Advanced Digital Training
Become proficient at digital testing techniques on the Agilent 3070 family combinational board test
Classroom Training
Agilent 3070 Boundary Scan Concept & Application
Learn concepts of Boundary-Scan technology (IEEE STD 1149.1).
Classroom Training
Agilent 3070 ICT Fundamentals
A quick overview of test concepts, the Agilent 3070 hardware and software.
Classroom Training
Agilent 3070 Maintenance
Gain an understanding of the Agilent 3070 service documentation, Confirmation and Diagnostics, System level card operation, power, analog, digital, and control subsystem operation and troubleshooting
Classroom Training
Agilent 3070 Programming
Buildng custom digital test libraries using Agilent Tools. Work with Pattern Capture Format and Vector Control Language Tests.
Classroom Training
Agilent 5DX Test Development Training
This course is for people who need to program the Agilent 5DX. It is also appropriate for Agilent 5DX test area managers seeking information on operating and programming the system to enable informed decisions regarding test strategies.
Classroom Training
Agilent AOI Post-Reflow User Fundamentals
Gain an understanding and practice the creation of a post-reflow inspection program on an AOI system. Learn how to create, modify and adjust algorithms. Become familiar with the result files.
Classroom Training
Agilent AOI Pre-Reflow User Fundamentals
Gain an understanding and practice the creation of a pre-reflow inspection program on an AOI system. Learn how to create, modify and adjust algorithms. Become familiar with the result files.
Classroom Training
Agilent EEsof Design Forum 2008 (MC18230)
Seminar materials for Agilent EEsof Design Forum 2008 (MC18230) on the 7th August 2008.
Seminar Materials - Archived
Agilent EEsof GENESYS RF Design Web Seminar - MC14237
Agilent EEsof GENESYS RF Design Web Seminar
Webcast
PDF PDF 2.11 MB Agilent EEsof Solutions for your RF Board Design Flow
Broadcast on 7th August 2008 - Seminar material for Agilent EEsof Design Forum 2008
2008-09-01 Seminar Materials
Agilent VEE Challenge 2008 2008-07-17 Seminar Materials
PDF PDF 00.99 MB Applications and Standards Support to Enable New Technologies
Pyramid Keynotes: Applications and Standards Support to Enable New Technologies
2009-04-03 Training Materials
PDF PDF 00.99 MB Applications and Standards Support to Enable new Technologies
Applications and Standards Support to Enable new Technologies
2009-04-22 Training Materials
PDF PDF 2.43 MB Enabling First Pass Success
Broadcast on 7th August 2008 - Seminar material for Agilent EEsof Design Forum 2008
2008-09-03 Seminar Materials
End-to-End 3G Seminar (English)
This presentation illustrates practical examples of how Agilent's end-to-end data test solutions can solve data transmission problems in 2.5 and 3G networks.
Webcast
ICA 2006
A 4-day exhibition of Asia's Leading Instruments, Control & Automation from 20-23 June 2006 at Kuala Lumpur Convention Centre, Malaysia.
Tradeshow
PDF PDF 1.25 MB Industry Enablement for DisplayPort
Industry Enablement for DisplayPort
2009-04-22 Training Materials
Instrument Control for Test Engineers Course
Gain a general understanding of Agilent instrument control and measurement.
Classroom Training
PDF PDF 2.08 MB Modeling Your Systems In ADS
Broadcast on 07th August 2008 - Seminar material for Agilent EEsof Design Forum 2008
2008-09-12 Seminar Materials
Nano-Electronic and Material Measurement Seminar (MC20999)
Complimentary half-day seminar happening on 11 December 2009 at Fusionopolis
Seminar

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