N9020A MXA Signal Analyzer

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Application Notes

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Titre/description Date Type
PDF PDF 783 KB Bluetooth® Manufacturing Test - A Guide to Getting Started (AN 1333-4)
Designed for electronic design/test engineers and managers who plan to manufacture products using Bluetooth™:wireless technology; 		2002-07-01 Application Note
PDF PDF 1.5 MB Dix éléments à prendre en compte pour choisir votre prochain oscilloscope
Cette note d’application passe en revue chaque considération essentielle pour choisir l’oscilloscope le mieux adapté à vos besoins de mesure. (PDF) 		2004-06-18 Application Note
PDF PDF 643 KB Test des RFIC avec interconnexions DigRF 2009-02-11 Application Note
PDF PDF 191 KB AN 4156-01 Ultra Low Current DC Characterization of MOSFETs at the Wafer Level
This application note shows how to precisely evaluate sub-threshold characteristics of a MOSFET device using 4156C's ultra low current measurement capability. 		2000-10-01 Application Note
PDF PDF 200 KB Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples. 		2007-07-08 Application Note
PDF PDF 2.33 MB 10 Gigabit Ethernet and the XAUI interface
This product note covers the use of the 71612C error performance analyzer when employed in testing the 10 Gigabit Ethernet and the XAUI interface. 		2002-08-01 Application Note
PDF PDF 189 KB 10 Good Reasons to Switch to LXI (AN 1465-21)
This application note will help you make the transition to LXI. It describes 10 key attributes that make LXI a good choice for your next test system, whether you choose to use LXI alone or within a hybrid combination of LXI and GPIB, VXI or PXI. 		2006-03-15 Application Note
PDF PDF 417 KB 10 Hints for Getting More From Your Function Generator (AN 1497)
The 10 hints in this application note will help you take advantage of the features of your function/arbitrary waveform generator so you can get your job done more easily. 		2008-07-16 Application Note
PDF PDF 263 KB 10 Hints for Getting the Most from your Frequency Counter
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements. 		2008-04-18 Application Note
PDF PDF 353 KB 10 Hints for Making Successful Noise Figure Measurements (AN 57-3)
This application note is designed to help engineers achieve accurate and repeatable noise figure. Ways to minimize measurement uncertainties and barriers to measurement repeatability are included. 		2009-09-18 Application Note
PDF PDF 708 KB 10 Practical Tips You Need to Know about Your Power Products
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads. 		2007-09-21 Application Note
PDF PDF 999 KB 10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer 		2007-12-03 Application Note
PDF PDF 211 KB 10 Steps to a Perfect Digital Demodulation Measurement (PN 89400-14A)
This Product Note provides a recommended procedure for configuring the Agilent 89400 Series Vector Signal Analyzers to demodulate and characterize a wide variety of digitally-modulated signals. Follow it step-by-step to insure that no important setup parameters are missed or incorrectly... 		2000-10-01 Application Note
PDF PDF 158 KB 10-Megasample-per-Second Analog-to-Digital Converter with Filter and Memory: Agilent (PN E1430A)
This Product Note is a reprint of the October 1993 Hewlett-Packard Journal article on the Agilent E1430A. 		2000-05-01 Application Note
PDF PDF 1.93 MB 101 of high speed optical component characterization
The application note gives you deep insight into the basics of electro-optical S-parameter test with the Lightwave Component Analyzer (LCA). 		2008-01-18 Application Note
PDF PDF 1.91 MB 10GbE Technology and Device Characterization with the 81250 ParBERT
A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements. 		2003-04-22 Application Note
15 Determinants in DC Power Supply Selection 2001-12-15 Application Note
PDF PDF 516 KB 16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures
This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors. 		2007-03-06 Application Note
PDF PDF 808 KB 16760A Logic Analyzer Module Triggering
This product note provides rules and guidelines that represent the actual limits of the hardware and compiler, plus examples illustrating compilable measurement constructions. 		2001-06-01 Application Note
PDF PDF 332 KB 2 GHz Balanced Mixer using SOT-23 Surface Mount Schottky Diodes (AN 997)
This Application Note is for information only. Agilent no longer sells or supports these products. 		1987-01-01 Application Note
33120A Option 001 External Clock Reference
Useful information about the Agilent 33120A Option 001 		2002-04-10 Application Note
PDF PDF 747 KB 3325A Synthesizer / Function Generator and 1000 Computer HP-IB Programming Guide (AN 401-13)
This Application Note is for information only. Agilent no longer sells or supports these products. 		1979-06-01 Application Note
PDF PDF 78 KB 34980A Multifunction Switch/Measure System Modules
This paper discusses switch topologies, switch types, and test system control functions and specific applications in which they are used. 		2005-07-18 Application Note
34980A Multifunction Switch/Measure Unit in Systems (8-slot mainframe)
Browse through this index of resources generated to ease your test-system design challenges. 		2005-11-15 Application Note
PDF PDF 59 KB 3D Inline Solder Paste Inspection - Benefit Realized
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects. 		2003-06-01 Application Note

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