U2722P Parametric Measurement Solution (I-V Curve Tracer)

• There-channel, four-quadrant source measure unit
• +/- 20 V, +/- 120 mA DC source per channel
• Intuitive GUI that is easy to configure and simplifies testing
• User-defined test profiles, and predefined test profiles for diode, bipolar junction transistors and field effect transistors
• Automatic test sequencing for parametric analysis
• Get I-V curve for discrete component devices in minutes, without the needs on programming
   

If you are looking for a basic yet complete IV curve tracer solution for component devices, then the new Agilent U2722P parametric measurement setup is up to the task. The included PMM Pro software and U2722A USB modular source measurement unit work seamlessly to analyze discrete semiconductor such as diode, bipolar junction transistors (BJTs) and field effect transistors (FETs), then plots, displays and logs the results in the form of IV curve, without the need to write a single line of programming code.

View the demo to draw the I-V curve for diode

View the demo to draw the I-V curve for Bi-polar junction transistor

View the demo to draw the I-V curve for Field effect transistor