PXI, AXIe, DAQ & Modular Solutions

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- English | 2010-08-17 | PDF 1.79 MB

Challenge the Boundaries of Test

A fresh perspective brings new possibilities to your toughest test scenarios. As we continue to innovate in PXI and AXIe, our goals are to help you accelerate time-to-market and achieve a lower cost of test. Through a growing range of modular products, we’re using our measurement expertise to bring you breakthrough capabilities.

Agilent’s lineup spans three different approaches to modular:

Open modular, when a meaningful degree of openness is achieved across multiple elements
Agilent-proprietary modular, when an important advantage is needed in a specific solution
Embedded modular, when any module is a component of a large, single purpose solution.

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PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis Application Note 2013-04-08	PDF 736 KB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test. Application Note 2013-04-05	PDF 748 KB
Pulse Parameter Definitions - Application Note Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A Application Note 2013-02-14	PDF 793 KB
Achieve High Speed, Multichannel Data Acquisition with the M9703A AXIe Digitizer apnote This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers. Application Note 2013-02-11	PDF 713 KB
Baseband Up-Conversion to Desired Intermediate Frequency with Regard to Signal Quality and Play Time Modulation bandwidth are increasing without compromising signal fidelity. this paper compares the different up-conversion methods to get best signal fidelity in the desired frequency range. Application Note 2012-12-03	PDF 546 KB
Frequency Agile Complex Signal Simulation with the Agilent M8190A Arbitrary Waveform Generator The Agilent M8190A Arbitrary Waveform Generator (AWG) generates complex, realistic test signals needed for today's sophisticated signal simulation and system test. Keywords: Arbitrary Waveform Generator,Long play time, frequency agile switching,signal scenario generator Application Note 2012-11-29	PDF 636 KB
Tips to Achieve PCIe Connectivity with your Agilent AXIe or PXIe Chassis Agilent's AXIe and PXIe chassis use PCIe as their primary communications link. Using the PCIe bus has many advantages such as availability of standard hardware, signaling methods and debug tools. Application Note 2012-07-07	PDF 876 KB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools Application Note 2012-07-04	PDF 1.18 MB
Simplify Complex High-speed Multichannel Acquisition Systems in Big Physics Experiments-Application This application note overview describes the use of Agilent modular products for high-speed multichannel acquisition systems in big physics experiments. Application Note 2012-03-19	PDF 651 KB Languages English \| 2012-03-19 \| PDF 651 KB 中文（简体） \| 2012-03-19 \| PDF 516 KB
Creating a Complete and Flexible Solution for WiGig Testing Application Note When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz Application Note 2011-06-13	PDF 2.18 MB Languages English \| 2011-06-13 \| PDF 2.18 MB 日本語 \| 2011-07-21 \| PDF 913 KB 中文（繁體） \| 2011-07-28 \| PDF 2.30 MB
Soft Touch Connectorless Logic Analyzer Probes Application Note 2011-03-14	PDF 193 KB Languages English \| 2011-03-14 \| PDF 193 KB 日本語 \| 2006-11-27 \| PDF 680 KB 한국어 \| 2006-11-01 \| PDF 193 KB
HDMI Sink and Source Compliance Test and Characterization In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform. Application Note 2006-10-27	PDF 431 KB Languages English \| 2006-10-27 \| PDF 431 KB 日本語 \| 2006-05-19 \| PDF 872 KB
Logic Analyzer Probing Techniques for High-Speed Digital Systems (AN 1450) Discusses the impact of adding logic analysis testability to PCB's. Examples of today's logic analyzer probing solutions are presented and the advantages and disadvantages of each solution are discussed. Application Note 2003-03-24	PDF 645 KB Languages English \| 2003-03-24 \| PDF 645 KB 日本語 \| 2003-05-14 \| PDF 1.07 MB