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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM
Research Resources
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Nanoindenters
Nanoindenters
Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.
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AFM - Atomic Force Microscopes
AFM - Atomic Force Microscopes
A wide range of high-precision atomic force microscopes (AFM). Agilent's atomic force microscope (AFM) products are designed to meet your research needs.
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Scanning Electron Microscopes
Scanning Electron Microscopes
The new Agilent 8500 FE-SEM is an innovative, research-grade system for imaging & characterizing materials at the nanoscale. Its compact size installs easily & delivers high resolution images and repeatable performance.
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Universal Testing Machine (UTM)
Universal Testing Machine (UTM)
The Agilent universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.
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