Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM
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1-25 of 177
| AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System
Data Sheet 2013-05-07 |
PDF
307 KB
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| Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers
Application Note 2013-04-08 |
PDF
188 KB
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| How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.
Application Note 2013-03-13 |
PDF
220 KB
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| In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.
Application Note 2013-03-12 |
PDF
186 KB
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| Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene
Application Note 2013-03-04 |
PDF
738 KB
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| Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM.
Application Note 2013-01-10 |
PDF
265 KB
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| Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.
Application Note 2013-01-03 |
PDF
174 KB
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| Statistical Variation and Strain-Rate Sensitivity of the Mechanical Properties of Individual PET Fib
Overview of strain rate and sensitivity of PET fibers
Application Note 2012-11-14 |
PDF
281 KB
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| Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art
Application Note 2012-11-08 |
PDF
1.19 MB
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| Rapid Calibration of Area Function and Frame Stiffness with Express Test1
Overview of “frame-stiffness” and “area-function” calibrations using Express Test
Application Note 2012-10-29 |
PDF
197 KB
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| PicoView Software Enhanced Imaging & Analysis Package
Overview of capabilities, features and benefits for PicoView AFM software.
Data Sheet 2012-09-06 |
PDF
347 KB
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| On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Agilent T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.
Application Note 2012-08-28 |
PDF
634 KB
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| Friction, Phase and KFM Characterization of Functionalized Graphene Oxide
Application Note 2012-08-09 |
PDF
443 KB
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| Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note
Application Note 2012-08-02 |
PDF
470 KB
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| Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers
Application Note 2012-07-13 |
PDF
310 KB
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| Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61)
Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61.
Application Note 2012-07-13 |
PDF
155 KB
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| Imaging Organic & Biological Materials with Low Voltage Scanning Electron Microscopy
Application Note 2012-06-27 |
PDF
666 KB
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| Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy
Application Note 2012-06-27 |
PDF
305 KB
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| Different Contrast Mechanisms in SEM Imaging of Graphene
Application Note 2012-06-26 |
PDF
380 KB
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| Imaging Graphene via low-voltage Field Emission Scanning Electron Microscopy
Application Note 2012-06-26 |
PDF
1007 KB
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| Low Voltage Scanning Electron Microscopy: Promises and Challenges
Application Note 2012-06-13 |
PDF
426 KB
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| Rapid Mechanical Characterization of Low-Dielectric-Constant Films
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.
Application Note 2012-06-12 |
PDF
448 KB
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| SMM Imaging of Dopant Structures of Semiconductor Devices
Application Note 2012-05-21 |
PDF
434 KB
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| Mapping the Mechanical Properties
Overview of Mapping mechanical properties of 2205 Duplex Stainless Stell Using the NEW Express Test.
Application Note 2012-04-23 |
PDF
289 KB
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| Quantitative Surface Potential Measurement Using KFM
Application Note 2012-04-20 |
PDF
433 KB
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