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PDF
803 KB
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Agilent 85194K IC-CAP BSIM4 Modeling Package
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2006-03-28
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技術概要
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Agilent EEsof EDA Device Model Support
Agilent EEsof EDA device model support table introduction.
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2009-04-21
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データシート
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PDF
352 KB
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De-Embedding Series-Connected/Transmission Configured Devices
This Technical Overview details the complete de-embedding methodology that has been successfully implemented in IC-CAP for device characterization and modeling purposes.
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2003-08-21
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技術概要
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PDF
1.61 MB
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Extraction of VBIC Model for SiGe HBTs using Gummel-Poon Model
This Paper presents a new model extraction methodology: extracting an advanced model via a simplified one. In particular a new methodology of extracting VBIC model via SGP model is detailed.
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2000-12-01
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技術概要
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PDF
270 KB
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Overview on EPHEMT Gate at Microwave Frequencies
This Paper examines the high-frequency behavior of the enhancement mode pseudomorphic high electron mobility transistor (EPHEMT) gate.
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2002-09-01
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技術概要
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PDF
1.06 MB
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Overview on Modeling of a TSOP44 Package
This Paper presents a step-by-step tutorial based on the IC-CAP model detailing how to model a TSOP44 package using the test fixture.
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2001-09-01
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技術概要
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PDF
562 KB
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Overview: A New Robust on-Wafer Noise Measurement and Characterization System
In this Paper, a new on-wafer flicker noise characterization system including test structure methodology is presented.
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2001-03-01
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技術概要
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PDF
628 KB
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Proposed System Solution for 1/f Noise Parameter Extraction
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.
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2000-12-01
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技術概要
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PDF
295 KB
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Verification of On-Wafer (SOLT) Calibration
This paper presents electrical characteristics standards required to perform a full 2-port verification on-wafer SOLT calibration using the Cascade 101-190 ISS and Infinity I40 GSG 150uM probes.
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2003-09-10
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技術概要
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