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EMI/EMC, Phase Noise, Physical Layer Test

EMI/EMC Solutions

  • From precompliance measurements and EMC diagnostics to full compliance testing, Agilent has what you need

Phase Noise Measurement Solutions 

  • Offer flexible testing of VCOs, DROs, crystal oscillators, synthesizers, amplifiers, converters, and measurement of CW, pulsed and spurious signals
  • Signal Source Analyzer – offers the highest measurement throughput and best usability in characterizing VCO or other types of high frequency signal sources, as well as clock jitter evaluation in high-speed data communication systems.

Physical Layer Test System

  • Vector network analyzer- and time domain reflectometer-based system to address signal integrity challenges of high-speed digital designs
  • EMI Receivers and EMC Precompliance Analyzers EMI Receivers and EMC Precompliance Analyzers 

    EMI Receivers and EMC Precompliance Analyzers

    • CISPR 16-1-1 2010 compliant EMI receiver for full compliance testing
    • Pre-compliance EMC measurement application for pre-compliance measurements and EMC diagnostic evaluation

  • Phase Noise Measurement Phase Noise Measurement 

    Phase Noise Measurement

    Signal source device design & test products & systems

  • N1930B Physical Layer Test System (PLTS) 2013 Software N1930B Physical Layer Test System (PLTS) 2013 Software 

    N1930B Physical Layer Test System (PLTS) 2013 Software

    The new Physical Layer Test System (PLTS) 2013 software is a powerful signal integrity tool for today’s high-speed digital designers.

  • Recommended Electronic Calibration (ECal) modules for VNA-based PLTS Recommended Electronic Calibration (ECal) modules for VNA-based PLTS 

    Recommended Electronic Calibration (ECal) modules for VNA-based PLTS