|
|
PDF
175 KB
|
4073A and Ultra Low Current Measurement Technologies (Product Note)
Ultra Low Current Measurement Technologies Employed in the 4073A Ultra Advanced Parametric Test System
|
2000-12-01
|
어플리케이션 노트
|
|
|
|
PDF
957 KB
|
A Complete Solution for Evaluating Write/Erase Characteristics of Flash Memory Cells
This application note describes how to use the Agilent 4082F Flash Memory Cell Test System and its high-voltage semiconductor pulse generator units to characterize state-of-the-art flash memory technologies such as MLC and high-density NAND flash.
|
2008-01-23
|
어플리케이션 노트
|
|
|
|
PDF
1.26 MB
|
A fully automatic on-wafer RF S-parameter measurement environment
This application note describes how the 4083A can perform not only DC IV and CV but also RF S-parameter measurements in a fully automated wafer probing environment.
|
2008-05-23
|
어플리케이션 노트
|
|
|
|
PDF
92 KB
|
Accurate and Efficient Frequency Evaluation of a Ring Oscillator. AN4070-3
Agilent 4070 Series Semiconductor Parametric Tester
|
2000-11-05
|
어플리케이션 노트
|
|
|
|
PDF
127 KB
|
Adapting Agilent 4070 series to open/short Measurement of YIELD TEST CHIP. AN4070-5
This application note describes the techniques required for adapting the Agilent 4070 series to quick yield ramp-up using Yield Test Chip testing.
|
2003-09-05
|
어플리케이션 노트
|
|
|
|
PDF
725 KB
|
AN 4070/4156-1 Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize both Agilent 4155C/4156C and 4073A to make these measurements.
|
2002-01-15
|
어플리케이션 노트
|
|
|
|
PDF
429 KB
|
AN 4156-05 Measurement of Power Devices Using External DC Power Supply
This application note describes how to connect the highly cost-effective 6650 series DC power supply to the 4155C/4156C.
|
2006-08-01
|
어플리케이션 노트
|
|
|
|
PDF
1.35 MB
|
AN B1500A-1 Measuring CNT FETs and CNT SETs Using the Agilent B1500A
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.
|
2005-03-31
|
어플리케이션 노트
|
|
|
|
PDF
1.7 MB
|
AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 3.1 software and explains the differences and similarities with respect to the 4155C and 4156C.
|
2007-11-28
|
어플리케이션 노트
|
|
|
|
PDF
1.19 MB
|
AN B1500A-3 IV and CV Measurement Using the Agilent B1500A MFCMU and SCUU
This application note describes how to make current-voltage and capacitance-voltage measurements using the B1500A multifrequency capacitance measurement unit and SMU CMU unify unit.
|
2005-08-01
|
어플리케이션 노트
|
|
|
|
PDF
790 KB
|
AN-1 Improving Test Throughput with Addressable Arrays and the Agilent N9201A
This application note explains the features and benefits of addressable arrays and explains how the N9201A can be used with addressable arrays to significantly improve test throughput.
|
2008-08-12
|
어플리케이션 노트
|
|
|
|
PDF
1.33 MB
|
DC Characterization of Semiconductor Power Devices
Shows practical measurement examples of how to characterize semiconductor power devices. [Product Note 4142B-1]
|
1991-09-01
|
어플리케이션 노트
|
|
|
|
PDF
1.01 MB
|
Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
|
2003-06-26
|
어플리케이션 노트
|
|
|
|
PDF
3.16 MB
|
High Speed DC Characterization of Semiconductor Devices From Sub pA to 1A (AN 356)
This Application Note is for information only. Agilent no longer sells or supports these products.
|
1987-11-01
|
어플리케이션 노트
|
|
|
|
PDF
177 KB
|
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.
|
2003-08-10
|
어플리케이션 노트
|
|
|
|
HTML
23 KB
|
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?
|
2002-12-18
|
어플리케이션 노트
|
|
|
|
PDF
23 KB
|
How do I connect the Agilent 4155A B or Agilent 4156A B to coaxial probes?
How do I connect the Agilent 4155A B or Agilent 4156A B to coaxial probes?
|
2002-12-18
|
어플리케이션 노트
|
|
|
|
PDF
19 KB
|
How do I find my Agilent 4155A B or Agilent 4156A B firmware revision?
Click the following link for details.
|
2002-12-18
|
어플리케이션 노트
|
|
|
|
PDF
2.02 MB
|
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
|
2009-06-17
|
어플리케이션 노트
|
|
|
|
PDF
283 KB
|
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
|
2008-12-10
|
어플리케이션 노트
|
|
|
|
PDF
1.62 MB
|
PN 4156-1 Differences from the 4155A / 4156B
The 4155B/4156B retains all the features and unprecedented accuracy of the 4155A/4156A, yet adds powerful new features. This product note describes these new features.
|
1998-01-31
|
어플리케이션 노트
|
|
|
|
PDF
340 KB
|
PN 4156-3 Prober Connection Guide
This guide provides information on how to connect a prober to the Agilent 4155C/4156C. It also provides the necessary part numbers, and tips for making measurements.
|
1999-02-01
|
어플리케이션 노트
|
|
|
|
PDF
517 KB
|
PN 4156-4 Advantages over the 4145A / 4145B
This product note describes the advantages of the 4155/4156 series and also compares it with the 4145A/4145B.
|
1999-07-01
|
어플리케이션 노트
|
|
|
|
PDF
504 KB
|
Simplification of DC Characterization and Analysis of Semiconductor Devices (AN 383-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
|
1989-12-01
|
어플리케이션 노트
|
|
|
|
PDF
3.31 MB
|
Techniques & Applications for High Throughput & Stable Characterization (AN 356-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
|
1988-08-01
|
어플리케이션 노트
|
|
