參數測試
整合式電路裝置每年持續在尺寸縮小、密度增加，及性能改進方面演進。在要保持及提高產能變得愈來愈困難的同時，即需製造和測試這些裝置。然而，安捷倫科技的參數測試解決方案繼續迎向這些挑戰，並提供使用者準確一致及高度自動的測試解決方案以有效地監控製程。我們得獎的參數測試系統為實質產業標準，有超過 2900 個系統安裝於全世界各地。安捷倫在「測試與量測」產業方面有超過 60 年的創新及領導歷史，最知道什麼是符合參數測試客戶的迫切需求。
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Parametric Test System Services
Parametric Test System Services
Service and support solutions are essential components in any semiconductor test operation. Explore a full suite of offerings available on Parametric Test Systems.
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Parametric Test Software
Parametric Test Software
Intuitive software solutions designed to help you measure, analyze, report, and manage parametric test data.
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Parameter & Device Analyzers, Curve Tracers
Parameter & Device Analyzers, Curve Tracers
See our new location for Parameter / Device Analyzers, Modular SMU Series and Low-leakage Switch Matrix Family
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88000 HS-100 High Speed and Sensitivity Array Test System
88000 HS-100 High Speed and Sensitivity Array Test System
Provides full thin film transistor (TFT) array testing for LTPS LCD and AM-OLED manufacturers.
Discontinued and Obsolete Parametric Test Equipment [已停產]
4155C, 4156C, 41000 Series, N9201A, 4070 Series, 4140B, 4142B, 4145A/B, 4155A, 4156A, 41501A, 4155B, 4156B, 4157A, 4157B,4280A, E5270A, E5272A, and E5273A
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