|
|
PDF
207 KB
|
5DX Series 5000 System Specifications
This is the datasheet for the Agilent Medalist 5DX Series 5000 AXI System
|
2007-08-01
|
데이터시트
|
|
|
|
PDF
41 KB
|
Agilent Automated X-ray Inspection 5DX Paperless Repair (PLR) vs. Medalist Repair Tool Comparison
This 2 page summary gives the specific comparisons between the 5DX Paperless Repair (PLR) and Medalist Repair Tool for comparison purposes.
|
2006-12-04
|
기술 개요
|
|
|
|
PDF
551 KB
|
Agilent Medalist i1000 In-Circuit Test System
Agilent Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution for original design manufacturers who need “just-enough tests”.
|
2009-04-15
|
데이터시트
|
|
|
|
PDF
444 KB
|
Agilent Medalist i3070
Product Specification for the Agilent Medalist i3070 is the next generation In-Circuit Test System (ICT).
|
2007-01-05
|
데이터시트
|
|
|
|
PDF
196 KB
|
Agilent Medalist i3070 ICT Program and Fixture Conversion Solution
This document provides an overview on how users can re-use existing Teradyne test programs and fixtures when switching to the Agilent In-Circuit Test platform.
|
2008-05-16
|
기술 개요
|
|
|
|
PDF
445 KB
|
Agilent Medalist i3070 Series 5 In-Circuit Test System
The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.
|
2009-08-28
|
데이터시트
|
|
|
|
PDF
155 KB
|
Agilent Medalist iVTEP - intelligent Vectorless Test EP
Building on the strength of TestJet and VTEP, Agilent intelligent Vectorless Test Extended Performance (iVTEP) can be used for ultra-small geometry packages, flip chips, as well as devices with minimal or no lead frames and heat spreaders.
|
2009-09-17
|
기술 개요
|
|
|
|
PDF
429 KB
|
Agilent Medalist SJ50 Series 3
This is the datasheet for the Agilent Medalist SJ50 AOI system
|
2006-09-15
|
데이터시트
|
|
|
|
PDF
211 KB
|
Agilent Medalist sj5000 Automated Optical Inspection Solution
This is the datasheet for the Agilent Medalist sj5000 AOI system
|
2008-04-01
|
데이터시트
|
|
|
|
PDF
171 KB
|
Agilent Medalist SP50 Series 3
The Agilent Medalist SP50 Series 3 is a high-speed inline or offline solder paste inspection system designed specifically for the SMT manufacturing marketplace.
|
2009-01-23
|
데이터시트
|
|
|
|
PDF
126 KB
|
Agilent Medalist x6000 Automated X-Ray Inspection Data Sheet
This is the datasheet for the Agilent Medalist x6000 AXI system
|
2008-03-13
|
데이터시트
|
|
|
|
|
Agilent Quality Tool Dashboards
Dashboards are preprogrammed targeted views that perform specific functions within the AQT software.
|
2003-09-30
|
기술 개요
|
|
|
|
PDF
123 KB
|
Agilent System Uptime Support Product Guide
This datasheet describes the level of support provided under each support product number for Agilent's range of support products for in-circuit test, imaging inspection and functional test systems.
|
2009-08-17
|
데이터시트
|
|
|
|
PDF
111 KB
|
Agilent Utility Card for In-Circuit Test
This datasheet describes the optional pin card called the Agilent Utility Card that will fit in a card
|
2009-08-28
|
데이터시트
|
|
|
|
PDF
475 KB
|
Agilent Vectorless Test EP
Building on the strength of TestJet, Agilent Vectorless Test EP provides dramatic unpowered test coverage improvements for BGAs, micro-BGAs and SMT connectors.
|
2004-04-01
|
기술 개요
|
|
|
|
PDF
933 KB
|
AwareTest xi Software Profile
Agilent AwareTest xi software allows Agilent 5DX and Agilent 3070 test systems to collaborate intelligently for shorter test cycles.
|
2002-04-29
|
데이터시트
|
|
|
|
|
Foundations for Intelligent Testing
Electronic products are becoming more complex. Lofty speeds and circuit densities unimaginable just a few years ago have become commonplace, and the trend shows no signs of abating.
|
2002-10-15
|
기술 개요
|
|
|
|
PDF
33 KB
|
ICT System Support Delivery Options
Support delivery guidelines for Agilent In-circuit Test Systems.
|
2009-05-18
|
기술 개요
|
|
|
|
PDF
396 KB
|
Intelligent Test Framework Software Solutions
Agilent's Intelligent Test Framework (ITF) and it's associated SQC / SPC and repair solutions, are optimized to work with Agilent testers enabling you to achieve your quality targets at a lower cost-per-assembly.
|
2003-07-25
|
기술 개요
|
|
|
|
PDF
226 KB
|
Manufacturing Test & Inspection Services & Support
Datasheet highlighting the new Medalist Support Program for Manufacturing Test & Inspection.
|
2008-04-24
|
데이터시트
|
|
|
|
PDF
626 KB
|
Medalist Quality Tool Datasheet
AQT provides statistical quality control and statistical process control analysis for Agilent test systems.
|
2003-11-01
|
데이터시트
|
|
|
|
PDF
201 KB
|
System Spares Onsite Agreement
This is the datasheet on system spares onsite agreement for uptime support
|
2007-08-15
|
데이터시트
|
|
|
|
|
Test Development Workstation - PC Hardware Requirements
PC Hardware Requirements Utilizing the recommended PC hardware with the Test Development Workstation (TDW) will improve the TDW performance. This document provides specific details to ensure success.
|
2006-09-01
|
기술 개요
|
|
|
|
PDF
366 KB
|
Using Bead Probes to Increase Test Access
This case study discusses how Prodrive, a Netherlands-basedelectronics manufacturer, successfully implemented the Agilent Technologies Medalist Bead Probe Technology to complement their existing test strategies.
|
2008-05-08
|
데이터시트
|
|
|
|
|
Using the Solutions Knowledge Base (SKB) for Medalist Printed Circuit Board Test Products
Learn about accessing the valuable Solutions Knowledge Base support tool for help with your test systems.
|
2007-11-01
|
기술 개요
|
|
