인-서킷 테스트 시스템 - 3070 ICT
애질런트는 강력한 제한적 액세스 테스트 솔루션 스위트로 지원되는 업계 최강의 Medalist i3070과 새롭게 선보인 저렴한 Medalist i1000 인서킷 테스터와 같은 수상 경력에 빛나는 인서킷 테스트 기술을 통해 고객의 요구를 충족시켜 왔습니다. 애질런트는 고객 제품에 필요한 모든 기능 테스트 요구를 충족시켜주는 포괄적 기능 테스트 솔루션도 제공하고 있습니다. 전자 테스트를 다시금 중점 분야로 채택한 애질런트는 현재는 물론 미래까지 고객의 요구를 충족시키는 첨단 기술을 제공한다는 약속을 지켜나갈 것입니다.
검사 비즈니스에서 철회한다는 애질런트의 최근 발표에 대해 문의할 사항이 있는 고객은 아래 웹 사이트를 방문하십시오. www.agilent.com/find/inspection.
새로운 AXI 지원 제품에 대해 자세히 알아보려면 새로운 AXI 지원 제품을 클릭하십시오.
수상 경력으로 입증된 애질런트의 획기적 업적을 살펴보십시오.
자세한 내용은 추가 제품 정보를 요청하십시오.
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제품 카테고리별
- 메달리스트 i3070 (65)
- Used 3070/i3070 ICT (56)
- 메달리스트 i1000 (11)
- 액세스 제한 테스트 제품 (12)
1-25 / 79
| Reducing Cost of Testing Prototypes with the Agilent Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Agilent Medalist i1000D as a viable option which can help save time and money.
어플리케이션 노트 2012-10-05 |
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324 KB
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| Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.
어플리케이션 노트 2012-09-19 |
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7.41 MB
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| Medalist i1000D with Board Handler - Application Note
The i1000D with JET board handlers enables low-cost ICT in a fully automated environment, with reduced labor cost while enabling higher test coverage for components on today's complex PCBAs.
어플리케이션 노트 2011-10-03 |
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| Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.
어플리케이션 노트 2011-08-01 |
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896 KB
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| How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.
어플리케이션 노트 2011-06-24 |
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1.09 MB
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| Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.
어플리케이션 노트 2011-06-23 |
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150 KB
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| Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.
어플리케이션 노트 2011-04-04 |
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2.39 MB
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| TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.
어플리케이션 노트 2010-12-22 |
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2.17 MB
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| Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Agilent Medalist i1000D platform to use state-of-the-art in-circuit test technology.
어플리케이션 노트 2010-10-22 |
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3.27 MB
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| Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Agilent Medalist i3070 in-circuit test solution.
어플리케이션 노트 2010-04-01 |
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207 KB
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| Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Agilent Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .
어플리케이션 노트 2010-03-15 |
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1.08 MB
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| Protecting the Integrated Circuit from Over Powering
This application describes how the power monitoring circuit on the Medalist i3070 Serie 5 in-circuit tester provides real-time monitoring to prevent damage to the ICs on the circuit boards.
어플리케이션 노트 2010-03-09 |
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| An Outlier Detection Based Approach for PCB Testing
This paper discusses enhancements to the capacitative leadframe testing technique, more commonly known as the Agilent patented VTEP technology. Reprinted with permission from IEEE.
어플리케이션 노트 2010-01-06 |
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1004 KB
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| Testing Bridges to Nowhere-Combining Boundary Scan and Capacitive Sensing
This paper describes existing limitations of the 1149.1 boundary scan techniques, IC design changes that would address these limitations and some experimental results. Reprinted with permission from IEEE.
어플리케이션 노트 2010-01-06 |
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455 KB
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| Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series
Agilent's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.
어플리케이션 노트 2009-12-02 |
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332 KB
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| Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Agilent VTEP, FrameScan FX and TestJet Enhanced technologies.
어플리케이션 노트 2009-11-03 |
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214 KB
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| Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.
어플리케이션 노트 2009-04-02 |
PDF
55 KB
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| Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.
어플리케이션 노트 2009-03-06 |
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342 KB
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| Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.
어플리케이션 노트 2009-03-04 |
PDF
801 KB
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| IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.
어플리케이션 노트 2008-11-24 |
PDF
297 KB
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| Medalist i3070 Test Throughput Optimization
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.
어플리케이션 노트 2008-11-24 |
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| Incorporating TCM Customizations into the Operator Interface of the Medalist i3070 ICT
users can use the old TCM operator interface, or the new i3070 Operator GUI and keep the operator interface customizations they are used to.
어플리케이션 노트 2008-11-01 |
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| Comparing Contact Performance on PCBA using Conventional Testpads and Bead Probe
This white paper captures the details of an evaluation performed on the notebook motherboard of a leading Original Equipment Manufacturer using Agilent Medalist Bead Probes Technology.
어플리케이션 노트 2008-10-31 |
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428 KB
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| First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.
어플리케이션 노트 2008-09-26 |
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131 KB
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| Slashing Debugging time with the Agilent Medalist i3070 In-Circuit Test AutoDebug Tool
This app note provides an overview of the AutoDebug tool on the Agilent Medalist i3070 In-Circuit Test Software version 07.00.
어플리케이션 노트 2008-09-01 |
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