Application-Specific Test Systems & Components
Ease system integration with Agilent System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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- Specifications (131)
- Manuals (218)
- Application Notes (124)
- Brochures & Competitive Overviews (47)
- Selection & Configuration Guides (23)
- Solution Briefs (4)
- Demos (15)
- Articles & Case Studies (12)
- Catalogs (5)
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1-25 of 581
| USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
PDF
2.02 MB
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| 87204/87206A,B,C Multiport Coaxial Switches dc to 4 GHz, dc to 20 GHz, dc to 26.5 GHz - Technical Ov
This document contains product description, top line specs, and ordering information for high performance multiport switches for microwave and RF instrumentation and systems. Additional model# 70611A Products: 87206B, 87204A, 87204B, 87204C, 87206A, 87206B, 87206C
Technical Overview 2013-05-10 |
PDF
873 KB
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| TS-5400 High Performance PXI Functional Test System with Mac Panel Interface - Data Sheet
Agilent's system onsite agreement provides short-term rental of the i3070 system, preconfigured according to the customer's needs, together with the latest hardware and software.
Data Sheet 2013-05-09 |
PDF
931 KB
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| Order the 2013 Lightwave Catalog
Order a free copy of - Volume 1 General Photonic Test and Volume 2 Transceiver Test; and/or download the Adobe file
Catalog 2013-05-09 |
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| Software Support Policy - Technical Overview
Software support policy for IO Libraries Suite, Command Expert, Fault Detective, and License Manager software
Technical Overview 2013-04-28 |
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| IO Libraries Suite Revision Information - Technical Overview
Description of supported I/O interfaces and operating systems with respective IO Libraries versions.
Technical Overview 2013-04-28 |
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| Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test.
Application Note 2013-04-18 |
PDF
783 KB
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| E8257D PSG Microwave Analog Signal Generator - Configuration Guide
This guide will assist you with the option selection alternatives and ordering process for the E8257D PSG.
Configuration Guide 2013-04-16 |
PDF
715 KB
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| Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Application Note 2013-04-12 |
PDF
1.36 MB
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| GPIB, USB and Instrument Control products - Data Sheet
Choose the best way to connect your PC to current instruments and take advantage of PC-standard interfaces. This family data sheet will give you the information you need to know about Agilent's I/O hardware products.
Data Sheet 2013-03-20 |
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| TS-5400 PXI Functional Test System user manuals
TS-5400 PXI Functional Test System user manuals and block diagrams
User Manual 2013-03-08 |
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| Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.
Application Note 2013-03-06 |
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| Order the 2013 Lightwave Catalog
Order a free copy of 3 volumes, and/or download the catalogs as Adobe file
Catalog 2013-02-28 |
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| Agilent Ultra Low Current Measurement Equipment －
Agilent’s stellar lineup of measurement equipment,from nanotechnology to high-power The best-suited equipment for your effective use
Brochure 2013-01-28 |
PDF
453 KB
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| Digital Multimeters - Brochure
This is the brochure for Agilent's range of digital multimeters from a bench top to a test rack to a handheld.
Brochure 2013-01-17 |
PDF
3.71 MB
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| Infiniium USB Test Option
The Infiniium USB Test Option provides a fast and reliable way to verify USB electrical specification compliance for USB 2.0 devices, hosts, and hubs.
Data Sheet 2012-12-10 |
PDF
1.21 MB
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| Enclosures Solutions Product Catalog
A 46-page catalog of rackmount kits, cabinets, testmobiles, and accessories. Most of the kits and accessories are intended for use only in Agilent racks.
Catalog 2012-12-03 |
PDF
3.32 MB
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| E8267D PSG Vector Signal Generator - Data Sheet
This data sheet provides specifications for the E8267D PSG vector signal generator.
Data Sheet 2012-12-02 |
PDF
5.38 MB
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| Agilent VEE Pro and The MathWorks MATLAB®
This matrix shows which version of MATLAB® is supported in each version of Agilent VEE Pro.
Configuration Guide 2012-10-25 |
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| TS-8900 PXI-Based Standard Platform for Automated Test Equipment Integration - Technical Overview
The Agilent TS-8900 standard PXI-based high performance shell platform offers self-integrators an efficient and cost effective base solution to meet their functional test needs.
Technical Overview 2012-10-22 |
PDF
458 KB
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| TS-8900 Automotive Electronics Functional Test System - Technical Overview
The TS-8900 provides higher throughput and higher test coverage while reducing your equipment capital costs for automotive electronics functional testing.
Technical Overview 2012-10-22 |
PDF
1.01 MB
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| IO Libraries Suite Unsupported Interface Support Matrix - Technical Overview
The support matrix for unsupported I/O hardware interfaces, Operating Systems, and Agilent IO Libraries revisions...
Technical Overview 2012-10-10 |
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| IO Libraries Suite Interface Support Matrix - Technical Overview
The support matrix for I/O hardware interface, Operating System, and Agilent IO Libraries revision...
Technical Overview 2012-10-10 |
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| IO Libraries Suite 16 - Data Sheet
This data sheet describes the ease of use and compatibility of the new I/O Libraries Suite 16.
Data Sheet 2012-10-08 |
PDF
383 KB
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| Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.
Article 2012-08-24 |
PDF
191 KB
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HTML
92 KB
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