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Base Price CA$ 8,946

Typically Configured Price CA$ 8,946

Configuration typique

Configuration typique

6812B Source/analyseur c.a., 0-300 Veff., 750 VA, phase simple. GPIB, RS-232

  • 6812B-120 Fonctionnement 104-127 V c.a., 50/60 Hz
  • R-51B-001-3C Return to Agilent Warranty - 3 years

Typically Configured Price CA$ 8,946

Prix pour: Canada (Français)

* Prix sujets à modification sans préavis. Les prix indiqués sont les prix de vente proposés par le manufacturier.

Key Features & Specifications

Output Ratings

  • Power: 750 VA
  • Voltage rms: 300 V
  • Current rms: 6.5 A
  • Repetitive & non-repetitive peak current: 40 A
  • Output Frequency Range DC; 45 Hz to 1 kHz

Ripple & Noise (20 kHz to 10 MHz)

  • -60 dB (relative to full scale)

Line & Load Regulation

  • Line regulation (% of full scale): 0.1%
  • Load regulation (% of full scale): 0.5%

Measurement Accuracy

  • Rms. Voltage (35 - 100 Hz): 0.03% + 100mV
  • DC Voltage: 0.05% + 150 mV
  • Rms. Current (45 - 100 Hz)
    o High Range: 0.05% + 10mA
    o Low Range: 0.05% + 1.5mA
  • Power (VA) (45 - 100 Hz)
    o High Range: 0.1% + 1.5VA + 12 mVA/V
    o Low Range: 0.1% + 1.5VA + 1.2 mVA/V

Description

The Agilent 6812B is ideal for applications such as power supply testing, UPS testing, avionics ATE, the testing of power factor corrected equipment and devices. Set up is made easy with the Graphical User Interface, which requires no programming. The Agilent 6812B provides a complete AC and DC power and measurement solution with extensive features to protect valuable DUTs.

Save space on a lab bench or in a test rack with this flexible instrument. With the built-in power analyzer, this AC Power Source / Power Analyzer combines the capabilities of a multimeter, oscilloscope, harmonic analyzer, arbritrary waveform generator, and power analyzer all in one device. This instrument may also be used to produce DC power, either alone or as a DC offset to an AC waveform. An optional second power analyzer is available, which can be used independently from the source, or for dual-node measurements such as power supply input/output efficiency tests.