Dynamic Signal Analyzers, Materials Measurement
Mechanical and physical test applications in laboratory or field environments.
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Notes d’application
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Notes d’application
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| Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
Notes d’application 2013-04-03 |
PDF
3.60 MB
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| Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
Notes d’application 2009-06-17 |
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| Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
Notes d’application 2008-10-28 |
PDF
1.65 MB
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| Split Post Dielectric Resonators for Dielectric Measurements of Substrates
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.
Notes d’application 2006-07-19 |
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| Is Phase Missing from your Diagnostic Toolbox?
We all know that dynamic signal analyzers provide some great frequency-domain tools for diagnosing rotating machinery problems. However, in a rush to FFT ourselves into the
frequency domain, it s too easy to overlook a powerful time-domain tool. Phase can be a real lifesaver when you re trying...
Notes d’application 2004-02-20 |
PDF
88 KB
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| Better, Safer Power Generation Measurements in Less Time
Attached is a White Paper by John Demcko of Arizona Public Service and John Jensen of Hewlett-Packard, first published in Realtime Update, Fall 1995 - Winter 1996, Hewlett-Packard, that discusses safer power generation measurements in less time. If you're trying to boost efficiency in an electric...
Notes d’application 2004-02-20 |
PDF
136 KB
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| Using Psycho-acoustic Analysis to Characterize Product Noise
In this White Paper by Josef Hobelsberger of Mueller BBM and Al Prosuk of m+p international, it's been said that the 20th century is not simply the age of industry, but the age of noise. No matter where we work, where we live, or what we do, noise surrounds us. Increasingly, product manufacturers...
Notes d’application 2004-02-20 |
PDF
77 KB
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| Working with Model 35670A Data Formats
The 35670A Dynamic Signal Analyzer is designed to be used primarily as a stand-alone instrument with the measurement results plotted on its display.
Notes d’application 2003-06-19 |
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| Migration Information for the 3852A Data Acquisition/Control Unit
The 3852A Data Acquisition/Control Unit has been a highly popular product since it's introduction in 1985.
Notes d’application 2003-02-19 |
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| Fundamentals of Signal Analysis Series (AN 1405-2)
This application note is a primerfor those who are unfamiliar with the class of analyzers we call dynamic signal analyzers. These instruments are particularly appropriate for the analysis of signals in the range of a few millihertz to about a hundred kilohertz.
Notes d’application 2002-08-06 |
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| Fundamentals of Signal Analysis Series (AN 1405-1)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains.
Notes d’application 2002-05-24 |
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| Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
Notes d’application 2001-12-19 |
PDF
666 KB
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| New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.
Notes d’application 2001-05-24 |
PDF
1.35 MB
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| Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.
Notes d’application 2000-11-01 |
PDF
378 KB
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| Precision Time-Domain Measurement Using the Agilent E1430A (PN E1430A-1)
This Product Note presents some key considerations in using the Agilent E1430A for acquisition of signals to be analyzed or displayed in the time domain.
Notes d’application 2000-08-01 |
PDF
166 KB
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| Fundamentals of Signal Analysis (AN 243)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...
Notes d’application 2000-06-01 |
PDF
3.37 MB
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| 8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
Notes d’application 2000-06-01 |
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| Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage
capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous
runout, and...
Notes d’application 2000-05-01 |
PDF
197 KB
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| Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to
experimental testing (such...
Notes d’application 2000-05-01 |
PDF
793 KB
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| 10-Megasample-per-Second Analog-to-Digital Converter with Filter and Memory: Agilent (PN E1430A)
This Product Note is a reprint of the October 1993 Hewlett-Packard Journal article on the Agilent E1430A.
Notes d’application 2000-05-01 |
PDF
158 KB
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| Control System Development Using Dynamic Signal Analyzers (AN 243-2)
This Application Note provides a review of the basic concepts of control systems, an introduction to the features and functions of DSAs that apply to control systems design and testing, and a glossary of control system terms. The Note discusses the key concepts engineers need to measure in...
Notes d’application 1998-03-01 |
PDF
420 KB
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| Effective Machinery Measurements Using Dynamic Signal Analyzers (AN 243-1)
This Application Note outlines the benefits of vibration analysis and provides basic information on making machinery measurements. It explains how vibration is converted to electrical signals and how the frequency domain helps users identify the comp. of signal. It also identifies the vibration...
Notes d’application 1997-12-01 |
PDF
1.40 MB
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| Vehicle Body Testing (AN 1270-5)
Application Note 1270-5 describes how an HP System submits a vehicle to a variey of test track stress conditions and measures the resulting performance on material fatigue and stress.
Notes d’application 1995-06-01 |
PDF
44 KB
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| On-Road Vehicle Testing (AN 1270-6)
In Application Note 1270-6 on-road prototype vehicle performance characterization is accomplished by the use of a 13 slot VXI Data Acquisition System and computerized real time data analysis.
Notes d’application 1995-06-01 |
PDF
49 KB
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| Prototype Jet Engine Characterization (AN 1270-3)
In Application Note 1270-3 a 13 slot VXI Data Acquisition System is used during the testing of jet engine prototypes to log data on a multitude of performance parameters to refine design characteristics.
Notes d’application 1995-06-01 |
PDF
48 KB
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