Oscilloscope

Oscilloscopes from extreme value to extreme performance.

Whether you need the fastest real-time oscilloscope on earth with the highest measurement accuracy anywhere, or something a little more basic, Agilent oscilloscopes outperform in every category. We are working continually to bring you oscilloscopes with breakthrough capabilities that help you solve your toughest measurement challenges. That’s why discerning engineers have made Agilent the fastest growing oscilloscope company in the world since 1997. Like you, we’re working on what’s next.

Looking for the next debugging oscilloscope? Check out the new InfiniiVision 4000 X-Series oscilloscopes

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81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane. Application Note 2004-10-12	PDF
Advanced Jitter Generation and Analysis Product Note This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope. Application Note 2004-10-04	PDF 549 KB
Verifying Bluetooth; Baseband Signals Using Mixed-Signal Oscilloscopes (AN 1333-3) This Application Note is a collaboration of Agilent and Texas Instruments' Bluetooth application engineering team and high-performance Bluetooth chipset. It highlights some key Bluetooth baseband measurements performed using an MSO. Application Note 2004-09-09	PDF 764 KB Languages English \| 2004-09-09 \| PDF 764 KB 中文（简体） \| 2004-09-09 \| PDF 764 KB 中文（繁體） \| 2001-04-01 \| PDF 1.02 MB 한국어 \| 2004-09-01 \| PDF 764 KB
Magneto-Optical Disk Drive Research (PN 3) This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive. Application Note 2004-07-29	PDF 275 KB
Side-by-Side Comparison of Agilent and Tektronix Probing Measurements When you make signal-integrity measurements on high-speed signals, the oscilloscope and probe you use can have a big impact on the accuracy of your measurements. Compare different manufacturers to find the best ones for your application. Application Note 2004-06-17	PDF 1.70 MB Languages English \| 2004-06-17 \| PDF 1.70 MB 中文（简体） \| 2004-06-17 \| PDF 1.70 MB 日本語 \| 2004-03-08 \| PDF 1.80 MB 中文（繁體） \| 2004-10-26 \| PDF 1.70 MB
Advantages and Disadvantages of Using DSP Filtering on Oscilloscope Waveforms As long as you are aware of the tradeoffs inherent in some filtering types, it makes sense to use DSP filtering to improve the accuracy and resolution of today’s real-time oscilloscopes. Application Note 2004-05-24	PDF 976 KB
High Precision Time Domain Reflectometry (AN 1304-7) Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements Application Note 2003-10-27	PDF 3.72 MB Languages English \| 2003-10-27 \| PDF 3.72 MB 日本語 \| 2004-04-20 \| PDF 4.07 MB
High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system. Application Note 2003-09-12	PDF 288 KB
Improving Optical Transceiver Extinction Ratio Measurement Accuracy This paper discusses how to improve optical transceiver extinction ratio measurement accuracy by using reference receiver correction factors. Application Note 2003-07-23
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals. Application Note 2003-06-30	PDF 1.70 MB Languages English \| 2003-06-30 \| PDF 1.70 MB 日本語 \| 2003-09-22 \| PDF 1.51 MB
10GbE Technology and Device Characterization with the 81250 ParBERT A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements. Application Note 2003-04-22	PDF 1.91 MB
Understanding and Using Offset in InfiniiMax Active Probes (AN 1451) This application note explains how offset is applied in the Agilent InfiniiMax Active Probes and how to use offset for various applications. Application Note 2003-03-31	PDF 928 KB Languages English \| 2003-03-31 \| PDF 928 KB 日本語 \| 2008-09-04 \| PDF 837 KB
Using ActiveX Controls to Enhance the Analysis Capabilities of Deep Memory and MSOs (AN 1445) AN 1445 examines the benefits of using ActiveX controls with deep memory and mixed analog/digital oscilloscopes. Application Note 2003-03-25	PDF 723 KB Languages English \| 2003-03-25 \| PDF 723 KB 日本語 \| 2003-06-12 \| PDF 769 KB
Performance Comparison of Differential and Single-Ended Active Voltage Probes (AN 1419-03) Explore performance and usability trade-offs for differential and single-ended probes. Application Note 2003-02-14	PDF 1.60 MB Languages English \| 2003-02-14 \| PDF 1.60 MB 中文（简体） \| 2003-06-05 \| PDF 730 KB 日本語 \| 2008-09-04 \| PDF 897 KB
Understanding Oscilloscope Frequency Response and Its Effect on Rise-Time Accuracy Learn which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors Application Note 2002-12-01	PDF 360 KB Languages English \| 2002-12-01 \| PDF 360 KB 日本語 \| 2003-01-27 \| PDF 322 KB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) Understand how to get minimal probe loading and highest-possible-performance representation of your signal. Application Note 2002-11-01	PDF 912 KB Languages English \| 2002-11-01 \| PDF 912 KB 中文（简体） \| 2003-06-05 \| PDF 1.20 MB 日本語 \| 2003-02-10 \| PDF 443 KB 中文（繁體） \| 2002-12-10 \| PDF 1.08 MB 한국어 \| 2002-11-01 \| PDF 806 KB
Finding Hidden Problems Using Aglent's Deep-Memory Oscilloscope: How IBM Solved a Mystery AN IBM CUSTOMER SUCCESS STORY As far as you can see everything is working properly - the right signals are getting to the right places at the right time, the firmware is doing what it is supposed to do and everything else is in order - and yet the system still doesn't function properly. Application Note 2002-04-03	PDF 1.34 MB Languages English \| 2002-04-03 \| PDF 1.34 MB 日本語 \| 2002-10-25 \| PDF 812 KB
Troubleshooting Agilent 54620/40-series Application Software Download Problems Troubleshooting Agilent 54620/40-series Application Software Download Problems Application Note 2002-04-01
Designing and Validating High-Speed Memory Buses (AN 1382-2) DDR SDRAM (double data rate synchronous dynamic random access memory) is quickly becoming an accepted technology in the PC (personal computer) industry. Its low cost, high performance, and increasingly wide availability make it very desirable for PC memory buses and embedded designs such as high... Application Note 2001-12-20	PDF 1.51 MB Languages English \| 2001-12-20 \| PDF 1.51 MB 日本語 \| 2002-04-04 \| PDF 633 KB
VXI Systems Help Test Crystal Oscillators This is an electronic manufacturing test case study Application Note 2001-12-20
Low Voltage Differential Signaling, (AN 1382-6) Using LVDS for High Speed Data Transmission Application Note 2001-12-17	PDF 2.53 MB Languages English \| 2001-12-17 \| PDF 2.53 MB 日本語 \| 2002-03-29 \| PDF 991 KB
Spectral Analysis Using a Deep Memory Oscilloscope FFT (AN 1383-1)) Many of today's digital oscilloscopes include a Fast Fourier Transform (FFT) for frequency-domain analysis. This feature is especially valuable for oscilloscope users who have limited or no access to a spectrum analyzer yet occasionally need frequency-domain analysis capability. An integrated... Application Note 2001-11-15	PDF 1.54 MB Languages English \| 2001-11-15 \| PDF 1.54 MB 日本語 \| 2002-04-08 \| PDF 962 KB
40 Gb/s and Return-to-Zero Measurements Using the 86100A Infiniium DCA (PN 86100-3) This note describes the evolution of the Agilent 86100A Infiniium DCA for 40 Gb/s test and how measurement requirements have been implemented in the instrument through improved hardware and firmware. Application Note 2001-11-15	PDF 1.61 MB
The Agilent Wedge: A Hands-free Solution For Probing Fine-Pitch ICs IC probes for 0.5mm and 0.65mm pitch ICs provide accurate, mechanically non-invasive contact to IC package pins with good electrical performance. Presents performance measurements. Application Note 2001-08-02
Correlating Software and Analog Outputs In a CAN Controller This is Hint 7 of the article "8 Hints for Debugging Microcontroller-based Designs" Application Note 2001-08-02