Materials Test Equipment
Materials test equipment and accessories for determining how materials interact with electromagnetic fields, by calculating permittivity and permeability. Accurate measurements of these material properties helps engineers achieve the best performance for an application, while shortening the design cycle and minimizing material scrap.
Read: Application note: Basics of measuring the dielectric properties of materials
Get help with: 8507x Series Service and Support
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- Specifications (4)
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1-25 of 28
| Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.
Brochure 2013-04-05 |
PDF
478 KB
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| Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
Application Note 2013-04-03 |
PDF
3.60 MB
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| 85071E Web Help
Instantly view the very latest information in the Materials Measurement software’s help file.
Help File 2012-06-27 |
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| 85070E Web Help
Instantly view the very latest information in the Dielectric Probe Kit software’s help file.
Help File 2012-06-27 |
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| 85071E Materials Measurement Software - Technical Overview
Agilent 85071E software determines the intrinsic electromagnetic properties of many dielectric and magnetic materials. The complete system is based on a versatile network analyzer that measures the material's response to RF or microwave energy. This 8-page, black & white product overview contains a product description, features and benefits, performance characteristics, software models and ordering information.
Technical Overview 2012-06-15 |
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| 85070E Dielectric Probe Kit, 200 MHz to 50 GHz - Technical Overview
Agilent's 85070E is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands. The 85070E software allows you to measure the complex dielectric constant of liquids and semisolids, including the dielectric loss factor or loss tangent. This 12-page, black and white technical overview contains product description, features/benefits, performance characteristics, menu items, and ordering information.
Technical Overview 2012-06-14 |
PDF
1.69 MB
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| 85072A 10-GHz Split Cylinder Resonator
This technical overview provides an overview of features, measuring examples, and specification of the 85072A 10 GHz split cylinder resonator.
Technical Overview 2012-05-08 |
PDF
989 KB
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| 85072A 10 GHz Split-Cylinder Resonator User’s and Service Guide
Provides information on making measurements, specifications, maintenance & troubleshooting, replaceable parts, and replacement procedures for the 85072A.
User Manual 2012-05-01 |
PDF
1.65 MB
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| LCR Meters, Impedance Analyzers and Test Fixtures Selection Guide
This 16-page, black-and-white selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures.
Selection Guide 2012-04-09 |
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| Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
Application Note 2009-06-17 |
PDF
2.02 MB
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| Network Analyzer Selection Guide (For Reference Only - Includes Discontinued Products)
This document does not contain the most up-to-date information. The document is available for reference only, for customers using legacy network analyzers. Current document:
http://cp.literature.agilent.com/litweb/pdf/5989-7603EN.pdf
Selection Guide 2009-02-03 |
PDF
1.95 MB
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| Installation Guide, 85070/1E Dielectric Probe Kit and Materials Measurement Software
Provides instructions for installing and configuring the 85070E and 85071E software products.
Installation Manual 2009-01-01 |
PDF
288 KB
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| Accessories Selection Guide For Impedance Measurements
Impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination Analyzers
Selection Guide 2008-12-17 |
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| Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
Application Note 2008-10-28 |
PDF
1.65 MB
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| Split Post Dielectric Resonators for Dielectric Measurements of Substrates
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.
Application Note 2006-07-19 |
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| Free Space Materials Measurement Seminar
Electromagnetic properties of materials, free space measurement techniques, calibration, measurement models, etc.
Promotional Materials 2005-09-21 |
PDF
1.47 MB
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| Microwave Dielectric Spectroscopy Workshop
Promotional Materials 2005-01-22 |
PDF
1.72 MB
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| Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
Application Note 2001-12-19 |
PDF
666 KB
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| 16452A Liquid Test Fixture Operation and Service Manual
16452A Liquid Test Fixture Operation and Service Manual
User Manual 2001-11-15 |
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| 16453A Dielectric Material Test Fixture Specification and Service Manual
16453A Dielectric Material Test Fixture Specification and Service Manual
User Manual 2001-11-15 |
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| 16008B Data Sheet
Technical specifications for the 16008B Resistivity Cell
Data Sheet 2001-08-01 |
PDF
47 KB
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| 16454A Magnetic Material Test Fixture Operation and Service Manual
This manual describes basic information needed to use the 16454A. It provides a general information, specifications, operation, and service information.
User Manual 2001-07-01 |
PDF
1.43 MB
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| New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.
Application Note 2001-05-24 |
PDF
1.35 MB
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| Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.
Application Note 2000-11-01 |
PDF
378 KB
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| 16451B DIELECTRIC TEST FIXTURE Operation and Service Manual
This manual describes basic information needed to use the 16451B. It provides a installation, general information, specifications, supplemental performance characteristics, operation, and service information.
User Manual 2000-10-01 |
PDF
1.67 MB
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