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PDF
599 KB
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8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
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2000-06-01
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어플리케이션 노트
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PDF
496 KB
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Agilent Basics of Measuring the Dielectric Properties of Materials
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2006-06-26
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어플리케이션 노트
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PDF
3.61 MB
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Agilent Radar Measurements
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
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2009-06-22
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어플리케이션 노트
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PDF
414 KB
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Dielectric Constant Measurement of Solid Materials (AN 380-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1989-10-01
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어플리케이션 노트
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PDF
378 KB
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Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.
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2000-11-01
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어플리케이션 노트
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PDF
2.02 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
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2009-06-17
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어플리케이션 노트
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PDF
666 KB
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Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
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2001-12-19
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어플리케이션 노트
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PDF
1.35 MB
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New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.
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2001-05-24
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어플리케이션 노트
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1.64 MB
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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
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2008-10-28
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어플리케이션 노트
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PDF
320 KB
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Split Post Dielectric Resonators for Dielectric Measurements of Substrates
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.
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2006-07-19
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어플리케이션 노트
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