85070M Dielectric Probe Measurement System, 3 GHz

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Spécifications principales

Hermetic glass-to metal seal, which makes it resistant to corrosive or abrasive chemicals
Withstands a wide -40° to +200° temperature range which allows measurements versus frequency and temperature
A special refresh calibration simplifies measurements over temperature
er´, er", tan delta or Cole-Cole plots; tabular listings of data
Hardcopy plots to plotters or graphics printers; tabular listing to printers; save/recall/export data via disk in MS-DOS® ASCII format or HP BASIC BDAT format (HP LIF binary).

Data Sheet
1998-01-01 | PDF 247 KB | order a copy

Description

The Agilent 85070M dielectric probe measurement system lets you measure the dielectric properties of materials quickly and conveniently. Measurements made with this probe are nondestructive and require no sample preparation -- saving you time, trouble, and materials. A measurement system based on the Agilent 85070B dielectric probe yields permittivity (dielectric constant), loss factor, loss tangent, or Cole-Cole diagrams -versus frequency- from 200 MHz to 20 GHz (depending on the network analyzer and material). The Agilent 85070M is a fully configured materials measurement system consisting of the Agilent 85070B dielectric probe kit, network analyzer, cable, probe stand, and pre-configured Agilent Vectra PC.

Hermetic glass-to metal seal, which makes it resistant to corrosive or abrasive chemicals
Withstands a wide -40° to +200° temperature range which allows measurements versus frequency and temperature
A special refresh calibration simplifies measurements over temperature
er', er", tan delta or Cole-Cole plots; tabular listings of data
Hardcopy plots to plotters or graphics printers; tabular listing to printers; save/recall/export data via disk in MS-DOS^® ASCII format or HP BASIC BDAT format (HP LIF binary).
MS-DOS is a U.S. registered trademark of Microsoft Corp.