85070D Product Photograph

85070D High-Temperature Dielectric Probe Kit

Product Status: Obsolete | No Longer Supported | Check for Calibration Availability

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The Agilent 85070D dielectric probe measures the dielectric properties of materials quickly and conveniently. Measurements made with this probe are nondestructive and require no sample preparation - saving you time, trouble, and material.

The dielectric probe is well-suited for measurements of liquid or semisolid materials. Simply immerse the probe into the material; there is no need for special fixtures. The Agilent 85070D dielectric probe yields permittivity (dielectric constant), loss facter, loss tangent, or Cole-Cole diagrams versus frequency - from 200 MHz to 20 GHz.

  • Runs on a PC, or internally on the PNA series of network analyzers, eliminating the need for both a PC and a GPIB card.
  • Guided calibration and measurement.
  • Measure permittivity over a broad frequency range (200 MHz to 20 GHz).
  • View measurement results in a variety of formats (er', er", tan delta or Cole-Cole).
  • Hermetic glass-to-metal seal makes the probe resistant to corrosive or abrasive chemicals.
  • Withstands a wide temperature range (-40C to +200C).
  • Compatible with a variety of network analyzers.
  • Component object model (COM) interface allows the measurement to be setup, triggered, and read from a user-written program. Example Visual Basic and Visual C++ projects are included to aid program development.

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