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PDF
599 KB
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8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
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2000-06-01
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Application Note
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PDF
116 KB
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Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.
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2008-04-10
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Application Note
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PDF
217 KB
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Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.
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1998-10-01
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Application Note
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PDF
386 KB
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Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...
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2000-11-01
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Application Note
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PDF
302 KB
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Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.
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1998-06-01
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Application Note
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PDF
2.02 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
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2009-06-17
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Application Note
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PDF
171 KB
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Impedance Measurements of Magnetic Heads Using Constant Current (AN 369-3)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-07-01
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Application Note
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PDF
663 KB
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Impedance Testing using Scanner (AN 369-6)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-09-01
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Application Note
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PDF
168 KB
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
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2006-06-26
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Application Note
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PDF
253 KB
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Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7)
This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test.
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2008-11-20
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Application Note
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PDF
570 KB
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Measuring Cable Parameters (AN 380-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1990-03-01
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Application Note
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PDF
283 KB
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Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
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2008-12-10
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Application Note
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PDF
442 KB
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Optimizing Electronic Component and Material Impedance Measurements (AN 369-1)
Impedance measurements are a basic means of evaluating materials and electronic components that support the technical innovations of electronic instruments and equipment. Impedance characteristics of the components used in circuits or of materials vary with frequency, signal level, or the signal...
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2000-10-01
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Application Note
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PDF
116 KB
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Recommending Electronic Manufacturers to Preform Inspections (AN 369-4)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-09-01
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Application Note
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PDF
1.64 MB
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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
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2008-10-28
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Application Note
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PDF
161 KB
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Tantalum Electroyltic Capacitor Measurements (AN 369-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-07-01
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Application Note
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PDF
321 KB
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Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
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2008-11-21
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Application Note
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