Learn about Metrology & Calibration Standards
Agilent Advantage Services
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Benefits
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Measurement confidence
Feel confident that every measurement is traceable to National Metrology Institutes (NMI) through Agilent-engineered calibration procedures that verify instrument specifications. -
Metrology advances
Rely on Agilent engineers who work with the NMI to develop scientific measurement techniques in emerging and existing technologies. -
Shared expertise
Stay up-to-date on changing compliance requirements and their practical applications by working with Agilent metrologists who guide international standards boards.
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| Calibration Video Series
The Agilent Advantage Services videos highlight how calibration meets technical and business goals. On the technical side that means accurate measurement results. On the business side it means lower cost of ownership.
Demo 2013-02-15 |
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| Paperless Calibration - White Paper
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.
Application Note 2013-01-25 |
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1.97 MB
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| Selecting a Calibration Vendor - White Paper
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?
Application Note 2012-12-11 |
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1.38 MB
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| Using a Manufacturer's Specification as a Type B Error Contribution - White Paper
Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents.
Application Note 2012-12-10 |
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1.13 MB
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| Defining Your Calibration Requirement - White Paper
These are the steps that can be taken when actually placing an order to ensure you get a "proper" calibration.
Article 2012-11-08 |
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1.57 MB
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| Instrument Design Validation and Recommended Calibration Policy - White Paper
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.
Application Note 2012-11-08 |
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1.22 MB
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| Setting and Adjusting Instrument Calibration Intervals
A well-defined calibration interval is one that balances the tradeoffs between the cost and inconvenience of the process and the need to keep test instruments performing within their specifications.
Application Note 2012-10-29 |
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643 KB
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| Connector Pin Recession and its Effect on Network Analyzer Accuracy - White Paper
Outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.
Application Note 2012-10-24 |
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762 KB
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| The Metrological & Financial Implications of a Clogged Fan Filter - White Paper
This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters.
Application Note 2012-10-24 |
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1.41 MB
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| Too Much Calibration? - White Paper
This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration.
Application Note 2012-10-24 |
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1.23 MB
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| The Six Axes Of Calibration - White Paper
To help demonstrate the variances in the deliverables and value of calibration due to lack of regulation. They have been split into 6 axes. This document discusses each of these axes.
Application Note 2012-10-24 |
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1.43 MB
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| Calibration Services & Repair Videos on YouTube
Explore YouTube for videos on Agilent's Calibration Services & Repair.
Demo 2012-10-19 |
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| Photonics Connector Care: Effects of Damage Connectors and Interfaces in Fiber Optic Measurements
To qualify or predict the effects of damaged fiber optic connectors or optical interfaces, a qualitative assessment can ensure that these connectors are kept in a condition of optimum performance.
Application Note 2012-10-14 |
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2.28 MB
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| Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.
Application Note 2012-10-14 |
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1.25 MB
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| Fully-Automatic DMM Calibration System - White Paper
Describes a fully-automatic calibration system for digtial multimeters (DMMs), including the uncertainty estimation of DC Voltage measurements.
Application Note 2012-10-14 |
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2.28 MB
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| Calibration of Precision Step Attenuators - White Paper
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.
Application Note 2012-10-14 |
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1.38 MB
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| A Guard-Band Strategy for Managing False-Accept Risk - White Paper
Presents guard-band strategy for managing false-accept risk with only limited knowledge of the a priori probability that a device is in tolerance.
Application Note 2012-10-09 |
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282 KB
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| Understanding Measurement Risk - White Paper
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.
Application Note 2012-10-09 |
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749 KB
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| Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.
Application Note 2012-10-02 |
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478 KB
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| Attenuation Measurement of Step Attenuators
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.
Application Note 2012-10-02 |
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440 KB
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| An Internet-Enabled Primary Impedance Measurement System - White Paper
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).
Application Note 2012-09-26 |
PDF
440 KB
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| Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5-mm connectors.
Application Note 2012-09-19 |
PDF
773 KB
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| Establishing Traceability for Quantities Derived from Multiple Traceable Quantities by Jian Liu
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.
Application Note 2012-06-15 |
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1.83 MB
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| Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.
Application Note 2011-11-16 |
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2.30 MB
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| Revisiting Mismatch Uncertainty with the Rayleigh Distribution by Michael Dobbert & Joe Gorin
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.
Application Note 2011-10-06 |
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1.17 MB
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