Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

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- English | 2010-09-13 | PDF 1.68 MB

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PFM Experiments with High Voltage DC/AC Bias Application Note 2010-09-09	PDF 562 KB
Measuring Substrate-Independent Young's Modulus of Low-k films by Instrumented Indentation Application Note 2010-08-31	PDF 263 KB
Measuring Substrate-Independent Young's Modulus Application Note 2010-08-31	PDF 347 KB
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization via Electron Channeling Contrast Imaging Application Note 2010-08-06	PDF 287 KB
Evaluation of Failure in Low-k Films Using Stiffness Mapping & Dynamic Imaging Application Note 2010-08-03	PDF 325 KB
Instrumented Indentation to Measure the Complex Modulus of Highly Plasticized Polyvinyl Chloride Application Note 2010-07-29	PDF 387 KB
Stiffness Mapping: a Dynamic Imaging Technique Application Note 2010-07-29	PDF 234 KB
8500 Field Emission Scanning Electron Microscope Data Sheet Data Sheet 2010-07-22	PDF 245 KB
Mechanical Testing of Carbon Nanotube Arrays Application Note 2010-06-28	PDF 1000 KB
Performance and Control of the Agilent Nano Indenter DCM Application Note 2010-05-11	PDF 884 KB
Mechanical Testing of Shale by Instrumented Indentation Application Note 2010-05-05	PDF 301 KB
Nanoindentation, Scratch, & Elevated Temperature Testing of Cellulose & PMMA films Application Note 2010-04-16	PDF 816 KB
Imaging Cells with the Agilent 6000ILM Application Note 2010-04-09	PDF 377 KB
Attofarad Capacitance Measurement with SMM Application Note 2010-04-08	PDF 325 KB
6000ILM Force Spectroscopy Application Note 2010-04-08	PDF 701 KB
Indentation Rules of Thumb Applications & Limits Application Note 2010-04-07	PDF 777 KB
Scratch Testing of Multilayered Metallic Film Stacks Application Note 2010-04-07	PDF 1.17 MB
Compositional Mapping of Materials with KFM Application Note 2010-03-25	PDF 1 MB
Several Aspects of High Resolution Imaging in Atomic Force Microscopy Application Note 2010-03-06	PDF 701 KB
Scratch Testing of Low-k Dielectric Films and a correlation Study of the Results Application Note 2010-03-01	PDF 468 KB
Agilent T150 UTM Agilent T150 UTM Data Sheet Data Sheet 2010-02-09	PDF 162 KB
Agilent Nano Indenter G200 Agilent Nano Indenter G200 Data Sheet Data Sheet 2010-02-09	PDF 162 KB
Agilent Nano Indenter G300 Agilent Nano Indenter G300 Data Sheet Data Sheet 2010-02-09	PDF 167 KB
Mechanical Evaluation of Titanium-nitride-coated Tool Steel Application Note 2010-01-19	PDF 409 KB
Young's Modulus of Dielectric "Low-K" Materials Application Note 2010-01-19	PDF 129 KB

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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

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