In-circuit Test Systems - 3070 ICT
Agilent offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today’s complex printed circuit assemblies.
Improve both board test coverage and test throughput at in-circuit test with i3070 and i1000D ICT systems that offer one of the best ROICs available in the market today.
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26-50 of 256
| 3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Agilent 3070/i3070 ICT systems.
User Manual 2012-01-25 |
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| Defect Coverage of Boundary-Scan Tests - Article Reprint
This paper discusses the potential and challenges with some defects when using the "PCOLA/SOQ" metric model in boundary scan test coverage.
Article 2011-11-04 |
PDF
245 KB
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| Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.
Article 2011-11-04 |
PDF
338 KB
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| In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.
Article 2011-11-04 |
PDF
67 KB
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| Test Coverage: What Does It Mean when a Board Test Passes? - Article Reprint
Defining board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage. This paper explores an alternative 'defect universe' to better depict test coverage.
Article 2011-10-27 |
PDF
89 KB
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| A New Probing Technique for High-Speed/High-Density Printed Circuit Boards - Article Reprint
This paper discusses how in-circuit test access can be maintained, even on highly dense gigabit logic boards.
Article 2011-10-24 |
PDF
341 KB
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| Medalist i1000D with Board Handler - Application Note
The i1000D with JET board handlers enables low-cost ICT in a fully automated environment, with reduced labor cost while enabling higher test coverage for components on today's complex PCBAs.
Application Note 2011-10-03 |
PDF
224 KB
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| Successful ICT Boundary Scan Implementation - Article Reprint
This paper details eight steps which can help you get the best possible boundary scan test coverage with your i3070 in-circuit tester.
Article 2011-08-08 |
PDF
111 KB
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| ICT Boundary Scan Development Steps - Article Reprint
This paper discusses how test point access and good data can make a big difference in the success of your boundary scan test. Best practises for boundary scan test development are also highlighted.
Article 2011-08-08 |
PDF
411 KB
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| LED Measurement Options at ICT - Article Reprint
This paper reviews current methods and constraints of LED color testing methodologies.
Article 2011-08-08 |
PDF
306 KB
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| A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.
Article 2011-08-08 |
PDF
269 KB
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| Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.
Application Note 2011-08-01 |
PDF
896 KB
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| Silicon Nails increases your test coverage
Demo 2011-07-22 |
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| Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5
Data Sheet 2011-07-14 |
PDF
214 KB
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| How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.
Application Note 2011-06-24 |
PDF
1.09 MB
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| Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.
Application Note 2011-06-23 |
PDF
150 KB
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| Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.
Application Note 2011-04-04 |
PDF
2.39 MB
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| In-circuit test – Still standing strong
Nay-sayers who about a decade ago started doubting the viability of in-circuit test should look at the thriving sub-ecosystem that is supporting this manufacturing test stalwart.
Article 2011-03-11 |
PDF
294 KB
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| In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.
Case Study 2011-02-11 |
PDF
1.12 MB
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| Agilent Medalist i3070 08.20p Software Release
The Agilent Medalist i3070 Software 08.20p release enables High Voltage Zener testing up to 60V with the ASRU Revision N card.
Release Notes 2011-02-08 |
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| Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.
Article 2011-01-13 |
PDF
966 KB
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| Programming In-System versus Offline-Article Reprint
Is offline programming or ISP at in-circuit test better? One key consideration is the cost of each method. This paper looks at pros and cons of these two methods contributing to the overall costing.
Article 2011-01-13 |
PDF
159 KB
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| TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.
Application Note 2010-12-22 |
PDF
2.17 MB
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| Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE
Article 2010-12-10 |
PDF
1.10 MB
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| Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE
Article 2010-12-10 |
PDF
402 KB
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