LCR 미터 및 임피던스 측정 제품
Agilent LCR 미터, 캐패시턴스 미터, 저항계, 임피던스 분석기는 다양한 연구 및 설계 어플리케이션과 부품 제조에서 부품과 자재를 테스트하는 데 유용합니다. LCR 미터는 스폿 주파수에서 임피던스(인덕턴스, 캐패시턴스, 저항)를 측정합니다. 캐패시턴스 미터는 스폿 주파수에서 캐패시턴스를 측정합니다. 저항계는 고저항 또는 저저항 측정에 최적화되어 있습니다. 임피던스 분석기는 일정 주파수 범위에서 임피던스(인덕턴스, 캐패시턴스, 저항)를 측정할 수 있는 가장 강력한 도구입니다.
상세 분류
분야별 검색결과
- 사양 (42)
- 매뉴얼 (182)
- 어플리케이션 노트 (85)
- 브로셔 및 경쟁 제품 개요 (30)
- 선택 및 구성 가이드 (15)
- 솔루션 개요 (4)
- 데모 (12)
- 기사 & 사례연구 (1)
제품 카테고리별
- 벤치탑 LCR 미터 및 저항계 (104)
- 임피던스 분석기 (105)
- U1700A 시리즈 핸드형 캐패시턴스 및 LCR 미터 (12)
- LCR 미터 및 임피던스 측정 제품 액세서리 (62)
126-150 / 371
| E4991A Technical Overview
This describes the E4991A 3GHz RF impedance/material analyzer and new 3 GHz test fixtures. It provides information for high frequency device evaluation such as chip inductor, chip capacitor and EMI filters.
기술 개요 2008-11-20 |
|
| New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...
어플리케이션 노트 2008-11-20 |
|
| 4395A, 4396B Technical Overview
Take an innovative approach to evaluating electronic components and circuits. The Agilent combination analyzers family combines three analyzer functions in one powerful instrument. Now you can use one analyzer for multiple needs.
기술 개요 2008-11-20 |
|
| Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7)
This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test.
어플리케이션 노트 2008-11-20 |
|
| Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
어플리케이션 노트 2008-11-13 |
|
| 4294A Technical Overview
The 4294A precision impedance analyzer provides accurate impedance measurement and analysis of a wide variety of electronic devices as well as electronic and non-electronic material.
기술 개요 2008-11-13 |
|
| 4285A Data Sheet
This document provides technical specifications for the 4285A Precision LCR Meter.
데이터시트 2008-11-12 |
|
| MEMS On-wafer Evaluation in Mass Production
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.
어플리케이션 노트 2008-11-12 |
|
| 4396B RF Network/Spectrum/Impedance Analyzer Configuration Guide
This configuration guide describes standard configurations, options, accessories and upgrades information for the 4396B Network/Spectrum/Impedance Analyzer
구성 가이드 2008-11-05 |
PDF
102 KB
|
| Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
어플리케이션 노트 2008-10-28 |
PDF
1.65 MB
|
| 16334A Test Fixture Operation and Service Manual
This manual describes basic information needed to use the 16334A. It provides a product overview, specifications, typical characteristics, operation, and service information.
사용자 매뉴얼 2008-09-01 |
PDF
559 KB
|
| High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.
어플리케이션 노트 2008-08-21 |
|
| Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.
어플리케이션 노트 2008-08-21 |
|
| E4980A Precision LCR Meter Service Guide
서비스 매뉴얼 2008-08-01 |
PDF
14.49 MB
|
| MEMS/NEMS 디바이스 측정 솔루션
애질런트는 MEMS/NEMS 디바이스의 특성 분석을 도와 줍니다.
어플리케이션 노트 2008-06-04 |
|
| 4338B Milliohmmeter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
42 KB
|
| 4339B High Resistance Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
35 KB
|
| 4278A 1kHz/1MHz C Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
40 KB
|
| 4268A Capacitance Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
37 KB
|
| 4285A Precision LCR Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
35 KB
|
| 4263B LCR Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
38 KB
|
| 4349B 4-Channel High Resistance Meter Firmware Revision History
릴리스 노트 2008-05-14 |
PDF
45 KB
|
| 4338B Security Features
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.
참조 가이드 2008-05-01 |
PDF
60 KB
|
| 4268A Technical Overview
High speed testing of high-value ceramic capacitors at constant test signal levels
기술 개요 2008-04-16 |
|
| 4339B/4349B High Resistance Meters - Technical Overview
This technical overview describes the 4339B/49B high resistance meter. The 4339B and 4349B are the enhanced models of the 4339A and 4349A. The B models provide clear and bright displays on a back-lit LCD panel for ease of use.
데이터시트 2008-04-15 |
myAgilent에 등록
제품 등록
왜 애질런트 일까요?