半導體參數/元件分析儀系列
本半導體元件特性分析儀器系列使用不同的方法,滿足今日多樣化的使用者需求。
本頁內容:摘要 · 服務比較 · 相關服務 · 產品與服務
摘要
新手和進階使用者皆可使用的完整參數測試解決方案
安捷倫的半導體參數/元件分析儀系列,可同時提供傳統和嶄新、工作導向的元件特性分析方式,以因應今日使用者種種不同的需求。具有深入硬體知識的資深使用者,會很讚賞 Agilent 4155/4156/4157 儀器的傳統參數分析儀功能。這些儀器對於已經專門為這些產品建立好演算法和軟體,卻不覺得有必要變更的現有使用者而言,是很好的選擇。對複雜硬體較不熟悉的新使用者,會發現 B1500A 以應用程式為主的量測方式,是一種直覺式、簡易使用的元件特性分析方式。
服務比較
| 分類 | 產品 | PC 控制器 配置 | 軟體 測試外殼 | 測試 方法 | 可用的 MFCMU | 支援的 SCUU | 支援的 ASU |
|---|---|---|---|---|---|---|---|
| 半導體參數分析儀系列 | 4155C、4156C、4157B | 外部 | Agilent I/CV 3.0 | 由下而上 (Buttom-up) | 無 | 無 | 有 (4157B) |
| 半導體元件分析儀系列 | B1500A | 整合 | Agilent EasyEXPERT | 由上而下 (Top-down) | 有 (B1500A) | 有 (B1500A) | 有 (B1500A) |
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1-22 / 22
| STAr Sagittarius Device Parametric Test Solution
STAr Sagittarius Device Parametric Test Solution
解決方案簡介 2012-12-11 |
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| The parametric Measurement Handbook - 3rd Edition
The parametric Measurement Handbook - 3rd Edition
型錄 2012-02-29 |
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| Readme for VXIPlug&Play Driver Version A.04.00 for E5250A
.
版本須知 2011-12-19 |
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| B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.
使用手冊 2011-08-01 |
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| E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.
使用手冊 2011-08-01 |
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| 使用 Agilent B1500A EasyEXPERT 軟體建立測試程序
本應用說明將於下列章節中,說明如何使用 CMOS 類別中現有的EasyEXPERT Id-Vd 與 Vth gmMax應用測試定義,建立新的測試程序定義
應用手冊 2011-02-14 |
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| Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
應用手冊 2009-06-17 |
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| B2200A/B2201A Low-leakage Switching Mainframe
Learn about technical specifications for B2200A and B2201A Switch Mainframe.
產品型錄 2009-02-25 |
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| Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
應用手冊 2008-12-10 |
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| Agilent B2200A Femtoamp 低漏電矩陣型切換器
半導體參數分析儀的使用者經常需要
搭配其它的儀器使用,如電容錶、高精度
數位電壓計、以及脈衝產生器等,然而,
要將這些不同的儀器全部整合在一起卻會
面臨許多量測上的挑戰。如果需以手動
的方式來切換三軸和同軸的纜線,就不可
能將DUT的量測作業自動化。
型錄 2007-04-05 |
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| Switching Matrix Product Brochure
Product brochure for the B2200A, B2201A and E5250A low-leakage switching matrices
型錄 2007-02-15 |
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| Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Agilent parametric measurement instruments.
選購指南 2006-11-21 |
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| AN B1500A-4 Customizing Agilent B1500A EasyEXPERT Application Test
This application note shows how easy it is to change the input parameter range in a furnished B1500A application test.
應用手冊 2006-09-21 |
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| Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
應用手冊 2003-06-26 |
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| What is the Agilent E5250A?
What is the Agilent E5250A?
應用手冊 2002-12-18 |
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| How do I connect the GND unit Agilent 41501B with the Agilent E5250A?
How do I connect the GND unit Agilent 41501B with the Agilent E5250A?
應用手冊 2002-12-18 |
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| How Do I Control the Agilent E5250A?
How Do I Control the Agilent E5250A?
應用手冊 2002-12-18 |
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| E5250A Low-leakage Switch Mainframe
Information on configurations, specifications,and other technical data.
應用手冊 2002-12-11 |
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| E5250A Low-leakage Switch Mainframe
Learn about technical specifications for E5250A Low-leakage Switch Mainframe.
產品型錄 2000-12-01 |
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| E5250A Low Leakage Switch Mainframe Setup Guide
This Setup Guide describes the configuration for various applications. It also provides necessary information to order accessories for the E5250A.
配置設定指南 2000-11-30 |
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| Evaluation of Hot Carrier Induced Degradation of Multiple MOSFET Devices. AN E5250A-2
This application note introduces you to Agilent’s new solution for evaluation of hot carrier induced
degradation of multiple MOSFET devices.
應用手冊 2000-11-05 |
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| Low Current Measurement with Agilent E5250A Switch Mainframe. AN E5250A-1
This application note introduces Agilent's new solution for precise characterization of multiple semiconductor devices by switching.
應用手冊 2000-11-01 |
