聯絡安捷倫專家

半導體參數/元件分析儀系列

本半導體元件特性分析儀器系列使用不同的方法,滿足今日多樣化的使用者需求。

本頁內容:摘要 · 服務比較 · 相關服務 · 產品與服務

摘要

新手和進階使用者皆可使用的完整參數測試解決方案

安捷倫的半導體參數/元件分析儀系列,可同時提供傳統和嶄新、工作導向的元件特性分析方式,以因應今日使用者種種不同的需求。具有深入硬體知識的資深使用者,會很讚賞 Agilent 4155/4156/4157 儀器的傳統參數分析儀功能。這些儀器對於已經專門為這些產品建立好演算法和軟體,卻不覺得有必要變更的現有使用者而言,是很好的選擇。對複雜硬體較不熟悉的新使用者,會發現 B1500A 以應用程式為主的量測方式,是一種直覺式、簡易使用的元件特性分析方式。

服務比較

分類
產品
PC 控制器
配置

軟體
測試外殼

測試
方法

可用的 MFCMU
支援的 SCUU
支援的 ASU
  半導體參數分析儀系列4155C、4156C、4157B
外部
Agilent I/CV 3.0
由下而上 (Buttom-up)


有 (4157B)
  半導體元件分析儀系列B1500A
整合
Agilent EasyEXPERT
由上而下 (Top-down)
有 (B1500A)
有 (B1500A)
有 (B1500A)

1-22 / 22

排序:
STAr Sagittarius Device Parametric Test Solution
STAr Sagittarius Device Parametric Test Solution

解決方案簡介 2012-12-11

PDF PDF 3.35 MB
The parametric Measurement Handbook - 3rd Edition
The parametric Measurement Handbook - 3rd Edition

型錄 2012-02-29

Readme for VXIPlug&Play Driver Version A.04.00 for E5250A
.

版本須知 2011-12-19

B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.

使用手冊 2011-08-01

E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

使用手冊 2011-08-01

使用 Agilent B1500A EasyEXPERT 軟體建立測試程序
本應用說明將於下列章節中,說明如何使用 CMOS 類別中現有的EasyEXPERT Id-Vd 與 Vth gmMax應用測試定義,建立新的測試程序定義

應用手冊 2011-02-14

Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

應用手冊 2009-06-17

B2200A/B2201A Low-leakage Switching Mainframe
Learn about technical specifications for B2200A and B2201A Switch Mainframe.

產品型錄 2009-02-25

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

應用手冊 2008-12-10

Agilent B2200A Femtoamp 低漏電矩陣型切換器
半導體參數分析儀的使用者經常需要 搭配其它的儀器使用,如電容錶、高精度 數位電壓計、以及脈衝產生器等,然而, 要將這些不同的儀器全部整合在一起卻會 面臨許多量測上的挑戰。如果需以手動 的方式來切換三軸和同軸的纜線,就不可 能將DUT的量測作業自動化。

型錄 2007-04-05

PDF PDF 1.43 MB
Switching Matrix Product Brochure
Product brochure for the B2200A, B2201A and E5250A low-leakage switching matrices

型錄 2007-02-15

PDF PDF 1.27 MB
Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Agilent parametric measurement instruments.

選購指南 2006-11-21

AN B1500A-4 Customizing Agilent B1500A EasyEXPERT Application Test
This application note shows how easy it is to change the input parameter range in a furnished B1500A application test.

應用手冊 2006-09-21

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

應用手冊 2003-06-26

What is the Agilent E5250A?
What is the Agilent E5250A?

應用手冊 2002-12-18

PDF PDF 29 KB
How do I connect the GND unit Agilent 41501B with the Agilent E5250A?
How do I connect the GND unit Agilent 41501B with the Agilent E5250A?

應用手冊 2002-12-18

PDF PDF 20 KB
How Do I Control the Agilent E5250A?
How Do I Control the Agilent E5250A?

應用手冊 2002-12-18

HTML HTML 6 KB
E5250A Low-leakage Switch Mainframe
Information on configurations, specifications,and other technical data.

應用手冊 2002-12-11

PDF PDF 112 KB
E5250A Low-leakage Switch Mainframe
Learn about technical specifications for E5250A Low-leakage Switch Mainframe.

產品型錄 2000-12-01

E5250A Low Leakage Switch Mainframe Setup Guide
This Setup Guide describes the configuration for various applications. It also provides necessary information to order accessories for the E5250A.

配置設定指南 2000-11-30

PDF PDF 1.83 MB
Evaluation of Hot Carrier Induced Degradation of Multiple MOSFET Devices. AN E5250A-2
This application note introduces you to Agilent’s new solution for evaluation of hot carrier induced degradation of multiple MOSFET devices.

應用手冊 2000-11-05

Low Current Measurement with Agilent E5250A Switch Mainframe. AN E5250A-1
This application note introduces Agilent's new solution for precise characterization of multiple semiconductor devices by switching.

應用手冊 2000-11-01