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5420 原子力显微镜(AFM)(N9498S)

产品状态: 接受订购 | 提供完善支持

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最新的固化软件及版本

版本: PicoView
发布日期: 2012-12-18

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AFM/SPM Accessories - Brochure

手册 2013-08-28

PDF PDF 1.17 MB
SMM Imaging of Dopant Structures of Semiconductor Devices

应用说明 2012-05-21

PDF PDF 434 KB
AFM Bibliography

基本演示 2012-01-11

AFM Image Library

基本演示 2012-01-11

Investigating Highly Dopant Marker Layers in GaN on Sapphire Using SMM

应用说明 2012-01-03

PDF PDF 448 KB
Scripting Interface for Enhanced Control of Agilent AFM Systems
Agilent PicoScript is an optional scripting interface package that greatly enhances the capabilities of Agilent PicoView, the imaging and analysis software that controls all Agilent AFM systems.

产品资料 2011-12-01

PDF PDF 124 KB
Post Processing Pico Image Software for Agilent AFM Systems
Pico Image surface imaging and analysis software is dedicated to Agilent AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

产品资料 2011-10-05

PDF PDF 619 KB
For your convenience you can now register for a FREE PDF copy of your AFM User Manual

用户手册 2011-07-15

Dynamic Current and Conductivity Measurement Using ResiScope

应用说明 2011-06-13

PDF PDF 339 KB
5420 SPM/AFM Data Sheet

产品资料 2010-10-07

PDF PDF 377 KB
PFM Experiments with High Voltage DC/AC Bias

应用说明 2010-09-09

PDF PDF 562 KB
面向科研领域、行业界和教育行业的AFM解决方案
面向科研领域、行业界和教育行业的AFM解决方案

手册 2010-04-16

PDF PDF 749 KB
Attofarad Capacitance Measurement with SMM

应用说明 2010-04-08

PDF PDF 325 KB
Imaging and Indenting - the pros and cons of stretching functionality

应用说明 2010-01-08

PDF PDF 419 KB
Liquid Cell and Sample Plate 5500 and 5100 AFM/SPM Data Sheet

产品资料 2009-12-04

PDF PDF 426 KB
Scanning Microwave Microscopy (SMM) for Semiconductor Failure Analysis

应用说明 2009-05-20

PDF PDF 147 KB
Using Thermal K to Calibrate the Spring Constants (k) of AFM Probes

应用说明 2008-12-05

PDF PDF 304 KB
Scanning Microwave Microscopy (SMM) Mode Highly Sensitive Imaging Mode for Calibrated Measurements

产品资料 2008-08-26

Scanning Microwave Microscope

应用说明 2008-08-26

PDF PDF 348 KB
Introduction to Scanning Microwave Microscopy

应用说明 2008-08-26

PDF PDF 334 KB
Application of Atomic Force Microscopy on Particle Characterization

应用说明 2008-03-31

PDF PDF 3 MB
Force Spectroscopy with Atomic Force Microscope
Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample.

应用说明 2008-03-25

PDF PDF 2.42 MB
Magnetic AC Mode III - the gentle touch for AFM

产品资料 2007-12-19

PDF PDF 755 KB
A New Approach to Generate Thiol-terminated SAMs on Gold

应用说明 2007-12-18

PDF PDF 389 KB
Piezoresponse Force Microscopy

应用说明 2007-12-03

PDF PDF 507 KB

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