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PDF
952 KB
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AN B1500-11 Characterizing Random Noise in CMOS Image Sensors
This application note describes how to characterize random noise in CMOS image sensor, and RTS noise measurement using the B1500A with the WGFMU module.
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2009-03-13
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Application Note
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PDF
726 KB
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AN B1500-12 1 micro second IV Characterization of Flash Memory Cells Using the Agilent B1530A
This application note describes how the B1530A WGFMU can be used to solve the measurement challenges faced when performing high speed IV characterization of flash memory cells.
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2009-03-05
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Application Note
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PDF
238 KB
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AN B1500-13 Measuring Pulsed/Transient Electrical Properties of OTFTs
This 12-page application note describes how to measure pulsed / transient electrical property of OTFT without additional measurement instruments.
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2009-05-18
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Application Note
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PDF
1.98 MB
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AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.
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2009-08-07
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Application Note
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PDF
1.35 MB
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AN B1500A-1 Measuring CNT FETs and CNT SETs Using the Agilent B1500A
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.
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2005-03-31
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Application Note
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PDF
1.27 MB
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AN B1500A-10 Ultra-Fast 1 us NBTI Characterization Using the Agilent B1500A's WGFMU Module
This application note explains how the B1500's WGFMU module provides solutions that meet the needs of ultra-fast NBTI measurement.
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2008-10-31
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Application Note
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PDF
1.7 MB
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AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 3.1 software and explains the differences and similarities with respect to the 4155C and 4156C.
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2007-11-28
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Application Note
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PDF
1.19 MB
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AN B1500A-3 IV and CV Measurement Using the Agilent B1500A MFCMU and SCUU
This application note describes how to make current-voltage and capacitance-voltage measurements using the B1500A multifrequency capacitance measurement unit and SMU CMU unify unit.
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2005-08-01
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Application Note
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PDF
1.01 MB
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AN B1500A-4 Customizing Agilent B1500A EasyEXPERT Application Test
This application note shows how easy it is to change the input parameter range in a furnished B1500A application test.
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2006-09-21
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Application Note
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PDF
1.04 MB
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AN B1500A-5 Creating a Test Sequence Using Agilent B1500A EasyEXPERT Software
This 12-page application note demonstrates how a test sequence can be created using tests from the CMOS category using the furnished EasyEXPERT "Id-VD" and "Vth gmMax" application test definitions as an example.
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2006-08-01
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Application Note
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PDF
317 KB
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AN B1500A-6 Accurate NBTI Characterization Using Timing-on-the-Fly Sampling Mode
This four-page application note details how the B1500A and Agilent's timing-on-the-fly NBTI test method solves many of the problems associated with traditional NBTI test methods.
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2006-10-01
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Application Note
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PDF
543 KB
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AN B1500A-7 Using the Agilent B1500A with a Nanoprober to Perform Failure Analysis
This application note introduces a new failure analysis technique that use nanoprobes and B1500A.
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2006-11-04
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Application Note
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PDF
745 KB
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AN B1500A-8 Multi-Channel Parallel Timing-on-the-fly NBTI Characterization Using Agilent B1500A
This four-page application note details how to implement the parallel NBTI using the B1500A by showing a preparation of the device setup for parallel testing.
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2007-04-01
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Application Note
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PDF
1.16 MB
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AN B1500A-9 Improving Flash Memory Cell Characterization Using the Agilent B1500A
This application note describes how the B1500A HV-SPGU module meets the needs of advanced NVM cell testing and how it can dramatically reduce test times.
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2008-05-28
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Application Note
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PDF
1.77 MB
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PN B1500-1 Pulse/arbitrary waveform generator with integrated measurement capabilities
The Agilent B1530A WGFMU is a pulse/arbitrary waveform generator with fast current or voltage sampling capabilities. This product note introduces various measurement applications enabled by unique features of the WGFMU.
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2009-10-16
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Application Note
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PDF
370 KB
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TO B1500A Easy High Power Pulsed IV Measurement Using the Agilent B1500A’s HV-SPGU Module
This document describes the high power pulsed IV measurement using the B1525A high voltage semiconductor pulse generator unit for B1500A semiconductor device analyzer mainframe.
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2009-04-01
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Application Note
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PDF
428 KB
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Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.
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2008-08-21
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Application Note
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