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B1500A Semiconductor Device Parameter Analyzer (Characterization System) Mainframe/EasyEXPERT

Product Status: Currently Orderable | Currently Supported

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Current Firmware/Software

Version: A.05.50.2013.0426
Release Date: 2014-02-28

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Concepts to HSDPA
High Speed Downlink Packet Access (HSDPA) technology allows for high data rates in the downlink and higher base station capacity, enabling the W-CDMA system to evolve to the professed 3.5G.

Training Materials 2004-09-20

PDF PDF 1.34 MB
Connecting Design and Test - Seminar Downloads
Connecting Design and Test: Accelerating Product Development seminar downloads.

Seminar Materials 2003-05-01

Connecting External Instrumentation to the Agilent 3070
This mini-lesson offers guidelines to use when connecting external instruments to the 3070. It talks briefly about the three major problems; what instrument to use, how to connect it, and how to control it.

Training Materials 2001-03-21

EXE EXE 3.69 MB
Connecting You To The Future
Presentation by Ned Barnholt at AutoTestCon 1998

Training Materials 2002-08-07

PDF PDF 106 KB
Conquering the High Power Source-Sink Test Challenge Webcast
Original broadcast June 18, 2014

Webcast - recorded

Content from the April, 2010 Automated Test / Board Test User Group Meeting - Cleveland
Adobe files of the material from the 2010 Cleveland User Group

Seminar Materials 2010-05-26

Correlating Microwave Measurements between Handheld and Benchtop Analyzers Webcast Q&A
Q&A from the July 24, 2013 webcast

Seminar Materials 2013-07-24

PDF PDF 103 KB
Correlating Microwave Measurements between Handheld and Benchtop Analyzers Webcast Slides
Slides from the July 24, 2013 webcast

Seminar Materials 2013-07-24

PDF PDF 1.54 MB
Create Complex and 2-Channel Signals with Trueform Generators Webcast
Live broadcast August 7, 2014; 10am PT/1pm ET/19:00 CET

Webcast

Custom OFDM: Understanding Signal Generation and Analysis
Originally broadcast July 20, 2011

Webcast - recorded

Data Preparation for AOI Programming – Bruce Isbell, Valor

Training Materials 2008-01-16

PDF PDF 3.76 MB
Dave Barnard
Dave Barnard - from the 2012 Cleveland meeting.

Seminar Materials 2012-05-17

PDF PDF 1.10 MB
DC Power supply fundamentals to get the most out of your applications
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

DDR memory Characterization Using a Mixed Signal Oscilloscope Webcast
Original broadcast October 16, 2013

Webcast - recorded

DDR Validation
Adobe .pdf of the paper presented at the High-Speed Digital Seminar, Ensuring MultiGigabit Design Success

Seminar Materials 2007-12-20

PDF PDF 1.91 MB
De-embedding Techniques in Advanced Design System
A detailed Seminar on De-embedding technique used in Advanced Design System. This presentation covers the need of de-embedding, S-Parameters, TRL design, 2-Port and 4-Port de-embedding.

Seminar Materials 2006-06-01

PDF PDF 2.95 MB
De-Mystifying Calibration Accreditation Webcast Slides
Slides from the January 15, 2013 webcast

Seminar Materials 2013-01-15

PDF PDF 1.65 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement Seminar Slides
Slides from the Optimizing High-Speed Digital Channels Using State-of-the-art Signal Integrity Tools Seminar on April 22, 2014

Seminar Materials 2014-04-22

PDF PDF 1.83 MB
Debug and Integration of Complex Embedded Systems: Improving Hardware and Software Debug of...
Embedded systems developers face increasing pressure to deliver products with more features that consume less power and cost less.

Seminar Materials 2001-08-02

Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

Webcast - recorded

Debugging and Characterization of Embedded PCI Express® Applications

Training Materials 2009-04-16

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope
This webinar will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Agilent’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Agilent’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

Debugging Microcontroller-Based Designs: Improving Hardware & Software Debug of Digital...
illustrates how to quickly capture and characterize mixed analog and digital signals using a mixed signal oscilloscope and advanced logic probe

Seminar Materials 2001-04-09

Debugging Serial Buses using an InfiniiVision Series Oscilloscope
EMEA Web seminar - Debugging Serial Buses using an InfiniiVision Series Oscilloscope

Webcast - recorded

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