Technical Support:
4073A Ultra Advanced Parametric Tester

Product Status:	Currently Orderable | Currently Supported
Product Upgrades:	Contact Agilent for details

Application Notes Refine the List no refinements available 1-4 of 4 Sort: Title Date Results Title/Description Date Type PDF 175 KB 4073A and Ultra Low Current Measurement Technologies (Product Note) Ultra Low Current Measurement Technologies Employed in the 4073A Ultra Advanced Parametric Test System 2000-12-01 Application Note order a copy PDF 127 KB Adapting Agilent 4070 series to open/short Measurement of YIELD TEST CHIP. AN4070-5 This application note describes the techniques required for adapting the Agilent 4070 series to quick yield ramp-up using Yield Test Chip testing. 2003-09-05 Application Note order a copy PDF 725 KB AN 4070/4156-1 Making Matching Measurements for Use in IC Design This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize both Agilent 4155C/4156C and 4073A to make these measurements. 2002-01-15 Application Note order a copy PDF 74 KB Ultra Advanced Parametric Test Solution Accelerates Ramp and Improves Process Yield Agilent 4073A and 4073B Ultra Advanced Parametric Tester accelerate the rampup of new processes and improve the yield on existing processes. 2000-08-01 Application Note order a copy 1-4 of 4