|
|
PDF
599 KB
|
8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
|
2000-06-01
|
Application Note
|
|
|
|
PDF
119 KB
|
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.
|
2008-04-03
|
Application Note
|
|
|
|
PDF
2.2 MB
|
Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.
|
2001-04-16
|
Application Note
|
|
|
|
PDF
2.02 MB
|
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
|
2009-06-17
|
Application Note
|
|
|
|
PDF
1.42 MB
|
Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.
|
2009-10-28
|
Application Note
|
|
|
|
PDF
322 KB
|
MEMS On-wafer Evaluation in Mass Production
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.
|
2008-11-12
|
Application Note
|
|
|
|
PDF
1.64 MB
|
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
|
2008-10-28
|
Application Note
|
|
