|
|
PDF
202 KB
|
Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.
|
2007-04-04
|
Application Note
|
|
|
|
PDF
121 KB
|
Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Agilent E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.
|
2007-04-04
|
Application Note
|
|
|
|
PDF
396 KB
|
High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.
|
2008-08-21
|
Application Note
|
|
|
|
PDF
2.02 MB
|
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
|
2009-06-17
|
Application Note
|
|
|
|
PDF
168 KB
|
Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
|
2006-06-26
|
Application Note
|
|
|
|
PDF
206 KB
|
Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.
|
2007-04-12
|
Application Note
|
|
|
|
PDF
243 KB
|
Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Agilent E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.
|
2007-04-13
|
Application Note
|
|
|
|
PDF
1.42 MB
|
Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.
|
2009-10-28
|
Application Note
|
|
|
|
PDF
253 KB
|
Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7)
This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test.
|
2008-11-20
|
Application Note
|
|
|
|
PDF
322 KB
|
MEMS On-wafer Evaluation in Mass Production
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.
|
2008-11-12
|
Application Note
|
|
|
|
|
MEMS/NEMS Device Measurement Solution
Agilent helps you characterize MEMS/NEMS device.
|
2008-06-04
|
Application Note
|
|
|
|
PDF
283 KB
|
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
|
2008-12-10
|
Application Note
|
|
|
|
PDF
1.64 MB
|
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
|
2008-10-28
|
Application Note
|
|
|
|
PDF
321 KB
|
Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
|
2008-11-21
|
Application Note
|
|
