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N5245A PNA-X Microwave Network Analyzer

Product Status: Peut être commandé | Support disponible

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Logiciel/micrologiciel courant

Version: A.02.01.18, 6 MB
Date de mise en circulation: 2013-02-01

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N5244/45AS Option H85 User’s and Service Guide
The N5244/45AS Opt H85 is a modified N5244/45A PNA-X Net An. Opt H85 will permit insertion of high power amplifiers, and other signal conditioning equipment, to allow measurements at RF levels up to 20 watts (+43 dBm) from 10 MHz to 50 GHz

Manuel de l'utilisateur 2009-09-01

PDF PDF 2.03 MB
Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz

Article 2009-07-23

Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test

Dossier de presse 2009-06-01

Setting a New Standard for Flexible Network Analyzers

Dossier de presse 2009-06-01

Understanding Nonlinear Vector Network Analysis

Dossier de presse 2009-04-15

Agilent Technologies Wins More Than 20 Annual Product Awards for Electronic Design, Measurement

Dossier de presse 2009-02-24

Agilent Demonstrates Unrivalled Range of Measurement Solutions at Electronica 2008

Dossier de presse 2008-11-11

Industry's Fastest Antenna Test Receiver -- 30 Percent Faster than Existing Solutions

Dossier de presse 2008-10-27

Making Fast and Accurate Antenna Measurements

Dossier de presse 2008-10-27

Agilent’s New Solutions for Microwave, RF, Wireless & Radar at 2008 European Microwave Conference

Dossier de presse 2008-10-26

Agilent’s PNA-X Achieves 100 Times Faster Swept-IMD Measurements with a Simple, Integrated Setup

Dossier de presse 2008-10-07

Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Notes d’application 2008-08-21

PDF PDF 428 KB
Langues 
Agilent Introduces Breakthrough Technology to Analyze Nonlinear Behaviors of Active Components

Dossier de presse 2008-06-02

Agilent Technologies' New Gain Compression Application Optimizes Accuracy, Speed of Amplifier Test

Dossier de presse 2007-12-10

Gain Compression Application for Amplifier Test
Amplifier designers and manufacturers characterize the compression level of amplifiers so the performance of RF chains or RF subsystems can be determined and optimized.

Présentation technique 2007-11-10

PDF PDF 582 KB
Langues 
PNA-X Application: Power-Added Efficiency (PAE) 1408-16

Notes d’application 2007-10-09

PDF PDF 935 KB
Langues 
Measuring Group Delay of Frequency Converters with Embedded LO

Notes d’application 2007-09-26

PDF PDF 1016 KB
Langues 
Agilent’s Embedded Local Oscillator Measurement Capability Sets New Standard

Dossier de presse 2007-09-10

Agilent Technologies' New Source-Corrected Noise-Figure Measurement Option

Dossier de presse 2007-09-03

Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

Article 2007-07-26

PDF PDF 624 KB
Agilent Technologies Displays Leading Line-up of Design, Test Products at 2007 IEEE MTT-S Conference

Dossier de presse 2007-06-04

Agilent Introduces True-Mode Stimulus Application for Accurate Characterization of Balanced Devices

Dossier de presse 2007-03-19

Agilent Technologies Introduces Premier-Performance Network Analyzer for Active Device Test

Dossier de presse 2007-02-01

Help - PNA Series Network Analyzers Online Help (User's Guide, Programmer's Guide - Printed Version)
This is the printed version (more than 2,000 pages) of the User's and Programming manual that is embedded in the PNA.

Fichier d'aide 2005-10-17

PDF PDF 10.53 KB

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