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5500 Atomic Force Microscope (AFM) (N9410S)

Product Status: Currently Orderable | Currently Supported

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Current Firmware/Software

Version: PicoView 1.12.4
Release Date: 2012-12-18

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mmWave Permittivity and Dielectric Loss Tangent Measurement System for sheet and ultra-thin sheet
KEYCOM Corp.

Solution Brief 2013-05-30

Capacitance Method - εr'/tanδ measurement of Plate, Ultra Thin Film, Compound Film, Liquid and Gel
Keycom Corp.

Solution Brief 2013-05-30

Laser Linewidth Measurement System
SYCATUS Corporation

Solution Brief 2013-05-13

40GHz RIN Measurement System
SYCATUS Corporation

Solution Brief 2013-05-13

Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System
Keycom Corp.

Solution Brief 2013-05-13

PENPROBE.CA RF Probe-test Solution up to 110GHz
Yokowo Co., Ltd.

Solution Brief 2013-05-13

RF Emissions Testing – EMSEC Solutions Inc. (ESI)
RF Emissions Testing Solution from ESI and Agilent.

Solution Brief 2013-04-24

Multiband Passive Intermodulation Testing – Power Technology Solutions (PTS)
Multiband Passive Intermodulation Testing from PTS and Agilent.

Solution Brief 2013-04-13

Spectrum Management for Efficient Bandwidth Allocation - X-COM
Spectrum Management Solutions for Efficient Bandwidth Allocation from X-COM and Agilent

Solution Brief 2013-04-13

RF Interference Troubleshooting with RF Editor and Playback Solution - X-COM
RF Interference Troubleshooting with RF Editor and Playback Solution from X-COM and Agilent

Solution Brief 2013-04-09

PXIe Data Streaming for RF Interference Analysis - X-COM
PXIe Data Streaming Solution for RF Interference and Spectrum Analysis from X-COM and Agilent

Solution Brief 2013-04-09

RF Spectrum Recording and Analysis - X-COM
RF Capture and Storage Solutions and Spectrum Analysis Software from X-COM and Agilent

Solution Brief 2013-04-08

RF Capture and Playback for Improved Communications Jamming - X-COM
RF Capture and Playback Solutions for Improved Communications Jamming from X-COM and Agilent

Solution Brief 2013-04-08

Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

Solution Brief 2013-03-20

Oscilloscope Probe Switching - BitifEye
Oscilloscope Probe Switching Solution from BitifEye and Agilent.

Solution Brief 2013-03-18

DisplayPort 1.2 Link Layer Testing - FuturePlus
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Agilent.

Solution Brief 2013-01-26

Aerospace/Defense RF Coaxial Cable Test - Beta LaserMike
Aerospace/Defense RF Coaxial Cable Test from Beta LaserMike and Agilent.

Solution Brief 2013-01-26

DDR4 Memory Bus Protocol Analysis - FuturePlus
DDR4 Memory Bus Protocol Analysis from FuturePlus and Agilent.

Solution Brief 2013-01-26

USB 3.0 Cable Testing - BitifEye
USB 3.0 Cable Testing Solution from BitifEye and Agilent.

Solution Brief 2013-01-15

Automated LAN Cable Test System - Beta LaserMike
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

Solution Brief 2012-12-20

Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Agilent

Solution Brief 2012-12-04

X-Parameter Measurements - Maury Microwave
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Agilent

Solution Brief 2012-12-04

Burn-In Test - LXinstruments
Burn-in Testing Solutions from LXinstruments and Agilent.

Solution Brief 2012-12-04

Mobile Phone Load Pull Measurements - Maury Microwave
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent

Solution Brief 2012-12-04

Noise Parameter Measurements - Maury Microwave
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent

Solution Brief 2012-12-04

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