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Materials Test Equipment

Materials Test Equipment

Materials test equipment and accessories for determining how materials interact with electromagnetic fields, by calculating permittivity and permeability. Accurate measurements of these material properties helps engineers achieve the best performance for an application, while shortening the design cycle and minimizing material scrap.

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GPIB Connectivity for 85070E and 85071E
View a step-by-step video on how to connect your 85070E dielectric probe kit or 85071E materials measurement software running on a PC to a PNA/ENA series network analyzer over a GPIB interface.

Demo 2014-04-11

LAN Connectivity for 85070E and 85071E
View a step-by-step video on how to connect your 85070E dielectric probe kit or 85071E materials measurement software running on a PC to a PNA/ENA/FieldFox series network analyzer over LAN.

Demo 2014-04-11

Accessories Selection Guide For Impedance Measurements - Selection Guide
This selection guide introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

Selection Guide 2014-01-24

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2013-09-27

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2013-08-15

Capacitance Method - εr'/tanδ measurement of Plate, Ultra Thin Film, Compound Film, Liquid and Gel
Keycom Corp.

Solution Brief 2013-05-30

mmWave Permittivity and Dielectric Loss Tangent Measurement System for sheet and ultra-thin sheet
KEYCOM Corp.

Solution Brief 2013-05-30

Advanced Materials Testing with the PNA and ENA Series Network Analyzers
This video introduces the material testing solutions based on the network analyzer

Demo 2013-05-27

Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System
Keycom Corp.

Solution Brief 2013-05-13

Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2013-04-05

PDF PDF 478 KB
85071E Web Help
Instantly view the very latest information in the Materials Measurement software’s help file.

Help File 2012-06-27

85070E Web Help
Instantly view the very latest information in the Dielectric Probe Kit software’s help file.

Help File 2012-06-27

85071E Materials Measurement Software - Technical Overview
Agilent 85071E software determines the intrinsic electromagnetic properties of many dielectric and magnetic materials. The complete system is based on a versatile network analyzer that measures the material's response to RF or microwave energy. This 8-page, black & white product overview contains a product description, features and benefits, performance characteristics, software models and ordering information.

Technical Overview 2012-06-15

85070E Dielectric Probe Kit, 200 MHz to 50 GHz - Technical Overview
Agilent's 85070E is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands. The 85070E software allows you to measure the complex dielectric constant of liquids and semisolids, including the dielectric loss factor or loss tangent. This 12-page, black and white technical overview contains product description, features/benefits, performance characteristics, menu items, and ordering information.

Technical Overview 2012-06-14

Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Agilent.

Solution Brief 2012-05-09

85072A 10-GHz Split Cylinder Resonator
This technical overview provides an overview of features, measuring examples, and specification of the 85072A 10 GHz split cylinder resonator.

Technical Overview 2012-05-08

PDF PDF 989 KB
85072A 10 GHz Split-Cylinder Resonator User’s and Service Guide
Provides information on making measurements, specifications, maintenance & troubleshooting, replaceable parts, and replacement procedures for the 85072A.

User Manual 2012-05-01

PDF PDF 1.65 MB
LCR Meters, Impedance Analyzers and Test Fixtures Selection Guide
This 16-page, black-and-white selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures.

Selection Guide 2012-04-09

Network Analyzer Selection Guide (For Reference Only - Includes Discontinued Products)
This document does not contain the most up-to-date information. The document is available for reference only, for customers using legacy network analyzers. Current document: http://cp.literature.agilent.com/litweb/pdf/5989-7603EN.pdf

Selection Guide 2009-02-03

Installation Guide, 85070/1E Dielectric Probe Kit and Materials Measurement Software
Provides instructions for installing and configuring the 85070E and 85071E software products.

Installation Manual 2009-01-01

PDF PDF 288 KB
Split Post Dielectric Resonators for Dielectric Measurements of Substrates
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.

Application Note 2006-07-19

Free Space Materials Measurement Seminar
Electromagnetic properties of materials, free space measurement techniques, calibration, measurement models, etc.

Promotional Materials 2005-09-21

PDF PDF 1.47 MB
Microwave Dielectric Spectroscopy Workshop

Promotional Materials 2005-01-22

PDF PDF 1.72 MB
Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

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