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In-circuit Test > Medalist i3070

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  • E9903E 4-Module In-Circuit Test (ICT) System, i307x Series 5 E9903E 4-Module In-Circuit Test (ICT) System, i307x Series 5 

    E9903E 4-Module In-Circuit Test (ICT) System, i307x Series 5

    The E9903E offers max 5184 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

  • E9988E In-Line 2-Module In-Circuit Test System; i337x, Series 5i E9988E In-Line 2-Module In-Circuit Test System; i337x, Series 5i 

    E9988E In-Line 2-Module In-Circuit Test System; i337x, Series 5i

    • The E9988E offers max 2592 nodes testing. Built to stringent specifications for SMEMA compatibility, it is easily integrated into existing SMT lines.

  • E9902E 2-Module In-Circuit Test (ICT) System, i307x Series 5 E9902E 2-Module In-Circuit Test (ICT) System, i307x Series 5 

    E9902E 2-Module In-Circuit Test (ICT) System, i307x Series 5

    The E9902E offers max 2592 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

  • E9905E 2-Module In-Circuit Test (ICT) system, i307x series 5 E9905E 2-Module In-Circuit Test (ICT) system, i307x series 5 

    E9905E 2-Module In-Circuit Test (ICT) system, i307x series 5

    The E9905E offers max 2592 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

  • E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5 E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5 

    E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5

    The E9901E offers max 1296 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput

  • N1194A Agilent Test Coverage Consultant Software N1194A Agilent Test Coverage Consultant Software 

    N1194A Agilent Test Coverage Consultant Software

    Agilent Test Coverage Consultant reads CAD layout files to generate a predictive test coverage report with PCOLA-SOQ metrics, doing away with the need of completing the tedious test development process before determining what is tested.

  • E2219E-FG TestSight Developer, ICT CAD Conversion Tool E2219E-FG TestSight Developer, ICT CAD Conversion Tool 

    E2219E-FG TestSight Developer, ICT CAD Conversion Tool

    TestSight Developer is the most cost effective CAD conversion solution in the market for Agilent Medalist i3070 and Medalist i1000. It offers fast and accurate CAD conversion, and supports numerous CAD formats.

  • N1128A-001 i3070 LED Test Box N1128A-001 i3070 LED Test Box 

    N1128A-001 i3070 LED Test Box

    • Tests up to 128 LEDs in less than 1.3 seconds.
    • Measures LED color in the 400-660nm range.
    • Returns intensity measurement in μW/cm2.

  • System Uptime Support Services System Uptime Support Services 

    System Uptime Support Services

    Professional, localized uptime support and end-to-end services that address real-world manufacturing challenges.

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