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Software

Agilent’s software offering covers a wide variety of applications that help you maximize the value of your instrument, gain insight into your design, or save time during test. From RF circuit design, through validation and characterization of your DUT, to creating your own programs and testing your products, Agilent’s software, combined with our instruments will help you get the job done.

  • Our industry leading EEsof EDA SW is specifically targeted to high frequency and RF circuit design.
  • Click on the Measurement Applications icon to explore an extensive set of applications that run inside the Instrument for all of the Digital and RF standards such as USB, PCI, LTE, and WiLAN plus more common measurements like jitter or noise figure.
  • If you’re creating your own programs, click on Instrument Control SW to see the range of tools that will help you connect your PC to your Instrument. VEE and MATLAB can add more sophisticated analysis as well.
  • We offer many PC-based SW packages for data viewing, analysis and characterization. Check out VSA, InfiniiView, Power Analysis Manager, Photonic Application Suite and Flex DCA.
  • For more extensive testing, PLTS, IFT, Wireless Test Manager, Parametric Measurement Manager Pro, Wideband Waveform Center, and Easy Expert can help you.
     

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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-03-25

PDF PDF 3.68 MB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
DOCSIS 3.1 Test Solution - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-03-19

PDF PDF 1.30 MB
Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

PDF PDF 5.41 MB
Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

PDF PDF 3.73 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2014-02-25

Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2014-02-10

Solutions for Emerging 4G and WLAN Communication Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2013-11-27

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Testing WLAN Devices According to the 802.11x Standards - Application Note
This application note provides a survey of transmitter/receiver test requirements for 802.11a, b, g, n, ac. It also presents an overview of Agilent’s solutions for WLAN testing.

Application Note 2013-10-21

CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2013-10-10

PDF PDF 2.61 MB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn how to perform CAN symbolic-level triggering and decoding using an Agilent 9000 Series oscilloscope.

Application Note 2013-09-24

PDF PDF 1.79 MB
Agilent Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Agilent E5071C ENA Option TDR

Application Note 2013-09-24

PDF PDF 1.95 MB
Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Application note
PC-based oscilloscope analysis software enables engineers to work remote from the target system and scope, and it makes sharing and analyzing data an easier experience.

Application Note 2013-09-05

PDF PDF 803 KB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Agilent Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 592 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn how to perform CAN symbolic-level triggering and decode with these step-by-step instructions.

Application Note 2013-07-29

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2013-07-24

PDF PDF 3.03 MB
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2013-06-06

EMI Troubleshooting: The Need for Close Field Probes - Application Note

Application Note 2013-05-29

PDF PDF 546 KB
Infiniium Oscilloscopes with 89600B VSA Software - Application Note
This application note describes the characteristics, setup, and operation of an Infiniium Series oscilloscope with 89600B vector signal analysis software to provide broadband vector signal analysis.

Application Note 2013-05-22

PDF PDF 5.39 MB
Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR

Application Note 2013-05-21

PDF PDF 2.13 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

GNSS Technologies and Receiver Testing - Application Note
This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions.

Application Note 2013-05-08

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