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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

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7500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-11-21

PDF PDF 997 KB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Notes d’application 2013-11-21

PDF PDF 163 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Notes d’application 2013-10-26

PDF PDF 331 KB
High Resolution Imaging with 7500 AFM - Application Note

Notes d’application 2013-10-24

PDF PDF 520 KB
Humidity-dependent AFM Nanolithography - Application Note

Notes d’application 2013-10-21

PDF PDF 128 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Notes d’application 2013-09-27

PDF PDF 142 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Notes d’application 2013-09-24

PDF PDF 226 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Notes d’application 2013-09-24

PDF PDF 234 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Notes d’application 2013-09-16

PDF PDF 184 KB
Surface Potential Measurements Using the Agilent 7500 AFM - Application Note

Notes d’application 2013-09-13

PDF PDF 452 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Notes d’application 2013-09-12

PDF PDF 157 KB
7500 AFM Applications in Polymer Materials - Application Note

Notes d’application 2013-09-12

PDF PDF 274 KB
Magnetic Force Microscopy Studies Using the Agilent 7500 AFM - Application Note

Notes d’application 2013-09-12

PDF PDF 524 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Notes d’application 2013-09-12

PDF PDF 122 KB
5500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-08-30

AFM/SPM Accessories - Brochure

Brochure 2013-08-28

PDF PDF 1.17 MB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Agilent Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2013-07-30

PDF PDF 592 KB
AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Fiche signalétique 2013-05-07

PDF PDF 307 KB
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Notes d’application 2013-03-04

PDF PDF 738 KB
5600LS AFM Enhanced Sample Versatility: 300mm Wafer Vacuum Chuck

Fiche signalétique 2013-03-01

PDF PDF 131 KB
5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck

Fiche signalétique 2013-03-01

PDF PDF 135 KB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Notes d’application 2012-08-09

PDF PDF 443 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Notes d’application 2012-06-27

PDF PDF 305 KB
SMM Imaging of Dopant Structures of Semiconductor Devices

Notes d’application 2012-05-21

PDF PDF 434 KB
Quantitative Surface Potential Measurement Using KFM

Notes d’application 2012-04-20

PDF PDF 433 KB

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