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Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Seeing is Believing:Video integration for Agilent UTM T150 - Application Note
Overview of features and benefits using video integration on the T150 UTM

Application Note 2013-01-16

PDF PDF 202 KB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Agilent T150 UTM.

Application Note 2013-01-10

PDF PDF 265 KB
Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.

Application Note 2013-01-03

PDF PDF 174 KB
34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.

Application Note 2012-12-26

PDF PDF 1.26 MB
USB Coaxial Switches for RF & Microwave Test and Measurement Applications - Application Note
This application note describes features and application examples for the U1810B USB coaxial switch, with options for measuring multiple DUT or performing multiple tasks with a single connection.

Application Note 2012-11-28

Technical Paper for Kalman Filter Based Modulation Analysis
Technical paper for Kalman Filter Based Modulation Analysis.

Application Note 2012-11-28

Statistical Variation and Strain-Rate Sensitivity of the Mechanical Properties of Individual PET Fib
Overview of strain rate and sensitivity of PET fibers

Application Note 2012-11-14

PDF PDF 281 KB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art

Application Note 2012-11-08

PDF PDF 1.19 MB
Rapid Calibration of Area Function and Frame Stiffness with Express Test1 - Application Note
Overview of “frame-stiffness” and “area-function” calibrations using Express Test

Application Note 2012-10-29

PDF PDF 197 KB
Reducing Cost of Testing Prototypes with the Agilent Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Agilent Medalist i1000D as a viable option which can help save time and money.

Application Note 2012-10-05

PDF PDF 324 KB
Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Application Note 2012-09-19

PDF PDF 7.41 MB
On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Agilent T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.

Application Note 2012-08-28

PDF PDF 634 KB
Achieve Measurement Accuracy and Flexibility in Your Microwave Test System Ap Note
The application note describes how to enhance measurement accuracy and flexibility in signal analysis by using the M9168C PXI programmable step attenuator module.

Application Note 2012-08-24

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2012-08-17

PDF PDF 942 KB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note

Application Note 2012-08-02

PDF PDF 470 KB
EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
IVI-COM driver and VISA-COM I/O programming examples in Microsoft Visual C# - Application Note
This application note details the installation instructions and Visual C# programming examples for Agilent Technologies IVI-COM instrument drivers and VISA-COM I/O.

Application Note 2012-07-30

PDF PDF 2.37 MB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers

Application Note 2012-07-13

PDF PDF 310 KB

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