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Starting From US$ 7,610

Typically Configured Price US$ 7,610

Typical Configuration

6811B AC source/analyzer, 0-300 Vrms, 375 VA, single-phase. GPIB, RS-232.

  • 6811B-120 104-127VAC operation, 50/60Hz
  • R-51B-001-Z Return to Service Center Warranty - 3 years

Typically Configured Price US$ 7,610

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Prices for: United States

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.

Key Features & Specifications

Output Ratings

  • Power: 375 VA
  • Voltage rms: 300 V
  • Current rms: 3.25 A
  • Repetitive & non-repetitive peak current: 40 A
  • Output Frequency Range DC; 45 Hz to 1 kHz

Ripple & Noise (20 kHz to 10 MHz)

  • -60 dB (relative to full scale)

Line & Load Regulation

  • Line regulation (% of full scale): 0.1%
  • Load regulation (% of full scale): 0.5%

Measurement Accuracy

  • Rms. Voltage (35 - 100 Hz): 0.03% + 100mV
  • DC Voltage: 0.05% + 150 mV
  • Rms. Current (45 - 100 Hz)
    o High Range: 0.05% + 10mA
    o Low Range: 0.05% + 1.5mA
  • Power (VA) (45 - 100 Hz)
    o High Range: 0.1% + 1.5VA + 12 mVA/V
    o Low Range: 0.1% + 1.5VA + 1.2 mVA/V

Description

The Agilent 6811B is ideal for applications such as power supply testing, UPS testing, avionics ATE, the testing of power factor corrected equipment and devices. Set up is made easy with the Graphical User Interface, which requires no programming. The Agilent 6811B provides a complete AC and DC power and measurement solution with extensive features to protect valuable DUTs.

Save space on a lab bench or in a test rack with this flexible instrument. With the built-in power analyzer, this AC Power Source / Power Analyzer combines the capabilities of a multimeter, oscilloscope, harmonic analyzer, arbritrary waveform generator, and power analyzer all in one device. This instrument may also be used to produce DC power, either alone or as a DC offset to an AC waveform. An optional second power analyzer is available, which can be used independently from the source, or for dual-node measurements such as power supply input/output efficiency tests.