5420 Atomic Force Microscope (AFM) (N9498S)
Key Features & Specifications
- Scientific-grade instrument delivers atomic resolution
- New design provides improved performance
- New electronics and techniques offer high-resolution KFM/EFM
- Cost-effective platform offers simple upgrade path
Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.
The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner, MACMode & MACMode III and temperature control
In addition, the 5420 offers users new electrical single-pass microscopy (ESPM) mode, which enables high-resolution KFM/EFM and PFM, as well as scanning microwave microscopy (SMM) mode, which allows highly sensitive calibrated electrical and spatial characterization.
Formation et Événements
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