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N4417A S-parameter Test Set, 30 kHz to 9 GHz

Product Status: Obsolete | No Longer Supported
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Key Features & Specifications

  • The following features apply to a complete balanced-measurement system:
  • Display conventional (single-ended) and mixed mode S-parameters
  • Re-normalize test data for non-50-ohm devices
  • Achieve high measurement accuracy with full four-port vector error correction
  • Perform fast, accurate, automatic calibrations with easy to use N4431A four-port electronic calibration (ECal) module
  • Calculate important parameters with powerful user-defined displays
  • Gain additional insight with time domain analysis option

Description

The Agilent N4417A S-parameter test set is a key component of an Agilent physical layer and balanced-measurement system. When combined with an Agilent PNA Series E8356A, E8357A, E8358A Option 015 or E8801A, E8802A, E8803A Option 014 vector network analyzer and an external PC equipped with an IEEE-488 GPIB card, this test set makes characterizing high-speed digital interconnects as well as, fully balanced or balanced-to-single-ended RF components much easier.

The N4417A S-parameter test set requires the N4425A Balanced Measurement System software or the N1930A Physical Layer Test System software for control of the 4-port VNA system, calibration, and data display and analysis.

Please note, this test set is not subject to a calibration test. The test set’s performance characteristics are parameters that the product is expected to meet before it leaves the factory. A functional test can verify proper performance of all microwave components within the test set.

  • The following features apply to a complete balanced-measurement system:
  • Display conventional (single-ended) and mixed mode S-parameters
  • Re-normalize test data for non-50-ohm devices
  • Achieve high measurement accuracy with full four-port vector error correction
  • Perform fast, accurate, automatic calibrations with easy to use N4431A four-port electronic calibration (ECal) module
  • Calculate important parameters with powerful user-defined displays
  • Gain additional insight with time domain analysis option