N5884A 1xEV-DO Enhanced Wireless Test Manager
|Product Status:||Obsolete | No Longer Supported|
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|Accelerate the Development of Wireless Device Tests with Automated Test Development and Support
This brochure explains how the Agilent Wireless Test Manager products make it easy it to automate test development, expedite time-to-market for wireless devices, and reduce test costs.
PDF 912 KB
|Wireless Test Manager Family - Configuration Guide
Wireless Test Manager Family Configuration Guide describes the powerful, easy to use test automation software for design and manufacturing to meet time to market goals and reduce test cost. It details the mapping of test managers to technologies and test applications. It also covers specific capabilities of each test manager as well as upgrade information.
Configuration Guide 2012-08-13
|Wireless Test Manager Compatibility Issues
The document describes how to get access to Microsoft Visual Studio 2003 now that it has been discontinued by Microsoft. The document also touches on compatibility issues between WTM and other MS Visual Studio versions.
Application Note 2009-01-15
PDF 484 KB
|8960 Wireless Test Set Ensures the Success of Your Wireless Products
The flexible solution for wireless device development, manufacturing, and repair
PDF 1.07 MB
|Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.
Application Note 2008-07-15
|Customizing the E656XC/N588XA Wireless Test Manager - Application Note
This document shows how to use the WTM program to perform extra test procedures and implement some of the program’s advanced capabilities.
Application Note 2007-07-30
|N5884A Release Notes
View release notes and revision history for the N5884A 1xEV-DO enhanced wireless test manager.
Release Notes 2007-06-19
|N5884A 1xEV-DO Enhanced Wireless Test Manager
This overview highlights the features of Agilent's test automation software for 1xEV-DO devices.
Technical Overview 2007-06-10
PDF 75 KB