I have always felt that time gating to improve a calibration in coaxial or waveguide should not be used but I am not clear on what Agilent teaches on this subject when it comes to materials measurements.
When I read application note
http://cp.literature.agilent.com/litweb/pdf/5954-1535.pdf on Page 7 under "Further Enhancements Using Gating" The load and source match are improved to produce less ripple in the measurement of PTFE .
Does Agilent still promote or suggest this technique for material measurements after a full 2 port cal is completed?
I own the latest Agilent 85071E with options but haven't explored this. Could someone from Agilent tell us if they promote time gating for a coax/waveguide calibration with their 85071 software these days?
