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Thread: Digital Testing now available on the i1000 !!


Permlink Replies: 4 - Pages: 1 - Last Post: Mar 23, 2012 4:24 AM Last Post By: adrianc Threads: [ Previous | Next ]
bodaiji

Posts: 4
Registered: 05/13/08
Digital Testing now available on the i1000 !!
Posted: Jul 29, 2009 9:43 PM
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Anyone like to talk about digital testing on the long wired fixtures ?!
ken_wu

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Registered: 09/17/09
Re: Digital Testing now available on the i1000 !!
Posted: Sep 17, 2009 10:40 PM   in response to: bodaiji in response to: bodaiji
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long wire fixture may be led to test digital IC unstable,Especially Eprom,I2C,SPI and so on.This device need precise clock and data signal.
leekwanwee

Posts: 12
Registered: 04/14/08
Re: Digital Testing now available on the i1000 !!
Posted: Mar 19, 2012 7:46 PM   in response to: ken_wu in response to: ken_wu
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@Ken, That is correct. And the reason behind why long wire and digital tests doesnt mix is that the long wires present a capacitive structure that allows the digital signals to couple over to the adjacent wires. This is crosstalks. In some cases, if the logic level of the digital signal is high, like CMOS or TTL level, a little crosstalk is tolerable. However, when the logic level goes lower, it is probably impossible to get a stable test over the long cables.

Some tester uses special cables(eg, coaxial cable) to handle their digital tests, like SPI, I2C programming. But then, this make it dedicated to the specific test points on the fixture... not a very flexible method.

Edited by: adrianc on Mar 20, 2012 10:08 AM
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leekwanwee

Posts: 12
Registered: 04/14/08
Re: Digital Testing now available on the i1000 !!
Posted: Mar 19, 2012 7:49 PM   in response to: leekwanwee in response to: leekwanwee
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Now this is where the i1000D makes a difference in the digital test. The i1000D digital pin card support both analog and digital resources. each digital resource on the card is matched with its own ground to that crosstalk can be minimised along the long cabling. This method allows the i1000D to perform different digital tests like Serial programming (SPI, I2C), Boundary scan, etc.

Edited by: adrianc on Mar 20, 2012 10:08 AM
adrianc


Posts: 69
Registered: 04/08/08
Re: Digital Testing now available on the i1000 !!
Posted: Mar 23, 2012 4:24 AM   in response to: leekwanwee in response to: leekwanwee
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Hi,
I hope this was helpful for you.

If you like there are other resources that may interest you.
Facebook: http://www.facebook.com/pages/Agilent-ICT/153919741304792
Youtube: http://www.youtube.com/user/AgilentMfgTestSys

Enjoy ... adrianc

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